Selection of test nodes for analog fault diagnosis in dictionary approach

Prasad, V.C.; Babu, Nithin

doi:10.1109/19.893273

Cited by 90 publications

(75 citation statements)

References 8 publications

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“…The integer coding method [1][2][3][4] is a popular test point preferred method, but the method is mainly for hard failure of the circuit, when it comes to soft failure, workload and ambiguity will be greatly increased, less effective. Recent studies Multi various intelligent optimization algorithms to integer coding method [5] , but its accuracy is still subject to the integer code table.…”

Section: General Instructionsmentioning

confidence: 99%

An Optimal Method of Test Point and Frequency Based on Global Sensitivity for Circuit Fault Diagnosis

Zijie¹,

Zhou²

2017

dtcse

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An optimal method of selecting test point and test frequency based on global sensitivity is proposed to overcome the problems of sub-network fault diagnosis for analog circuit. Parametric plotter is used with Pspice to avoid circuit topology analysis and tedious calculation process with time saving. Considering the parameters influencing element, the concept of global sensitivity of the network is defined, and as a basis to compare fault diagnosis capabilities of test points in different frequencies, optimal test point and test frequency is selected. Finally, an example is given to show efficiency of the method. Experimental results show that the new method improve the efficiency of diagnosis identify.

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Section: General Instructionsmentioning

confidence: 99%

An Optimal Method of Test Point and Frequency Based on Global Sensitivity for Circuit Fault Diagnosis

Zijie¹,

Zhou²

2017

dtcse

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“…In [17], the selection of test nodes has been studied extensively and efficient techniques, called inclusion methods and exclusion methods, were proposed. The order of computation of the methods depends linearly on the number of test nodes.…”

Section: Previous Work and State-of-the-artmentioning

confidence: 99%

“…The frequency used was 1000 Hz (note: we can use any number of test frequencies in our work). The faults under study were also catastrophic; in fact, they were the same used in [17].…”

Section: Previous Work and State-of-the-artmentioning

confidence: 99%

A Tool for Single‐Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T‐Vector Approach

Augusto

Almeida

2008

VLSI Design

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In previous works of these authors, a technique for doing single-fault diagnosis in linear analog circuits was developed. Under certain conditions, one of them assuming nominal values for the circuit parameters, it was shown that only two measurements taken on two selected circuit nodes, at a single frequency, were needed to detect and diagnose any parametric fault. In this paper, the practical value of the technique is improved by extending the application to the diagnosis of faults in circuits with parameters subject to tolerance. With this in mind, single parametric faults with several strengths are randomly injected in the circuit under study and, afterwards, these faults are diagnosed (or the diagnosis fails). Results are reported on a simple active filter. Conclusions are drawn about the robustness and effectiveness of the technique.

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“…Van Spaandonk and Kevenaar [7] combined the decomposition method of system sensitivity matrix and an iterative algorithm to search a set of test points for analog circuits. Prasad and Babu [8] proposed four algorithms based on inclusive approaches and exclusive approach. An entropy index method was proposed to search for a local minimum test point set [1].…”

Section: Introductionmentioning

confidence: 99%

Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

Meng

Zhou

et al. 2018

Mathematical Problems in Engineering

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The demand for testability analysis has increased with the integration densities and complexity of circuits. As an important part of testability analysis, the test point selection method needs to be researched in depth. A new similarity coefficient criterion is proposed to determine the fault isolation degree because output responses of a circuit with component tolerance are approximately subject to the normal distribution. Then, a new test point selection method is proposed based on the fault-pair similarity coefficient criterion information table. Simulation experiments are used to validate the accuracy of the proposed method in terms of the optimum test point set and fault isolation degree. The results show that the proposed method improves the performance of test point selection by comparing with the other reported methods.

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Selection of test nodes for analog fault diagnosis in dictionary approach

Cited by 90 publications

References 8 publications

An Optimal Method of Test Point and Frequency Based on Global Sensitivity for Circuit Fault Diagnosis

An Optimal Method of Test Point and Frequency Based on Global Sensitivity for Circuit Fault Diagnosis

A Tool for Single‐Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T‐Vector Approach

Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

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