2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide &Amp; Related Materials (IPR 2016
DOI: 10.1109/iciprm.2016.7528579
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Selective area grown AlGaInAs multi-quantum wells characterization and modeling for photonic integrated devices

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Cited by 2 publications
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“…The diffraction patterns were dominated by the QW diffraction and InP (004) diffraction peaks. The peak at 63.345° (for two theta) was originated from the InP layer and interference patterns located at the side vicinity were from AlGaInAs QW [ 20 ]. Interference fringes distributed over a wide angle range were affected by the composition and thickness of the Al 0.07 Ga 0.22 In 0.71 As quantum well and Al 0.225 Ga 0.285 In 0.490 As barriers.…”
Section: Resultsmentioning
confidence: 99%
“…The diffraction patterns were dominated by the QW diffraction and InP (004) diffraction peaks. The peak at 63.345° (for two theta) was originated from the InP layer and interference patterns located at the side vicinity were from AlGaInAs QW [ 20 ]. Interference fringes distributed over a wide angle range were affected by the composition and thickness of the Al 0.07 Ga 0.22 In 0.71 As quantum well and Al 0.225 Ga 0.285 In 0.490 As barriers.…”
Section: Resultsmentioning
confidence: 99%
“…The GRE induced by SAG has been known for over 40 years. [17,18] Nevertheless, recent advances on micro-X-Raydiffraction (μXRD) and microphotoluminescence (μPL) characterization [19] and the development of a comprehensive vapor phase diffusion (VPD) model [20] have unlocked a viable SAG approach for a monolithic InP platform. For the case of multiple quantum wells (MQWs), the GRE allows for bandgap engineering as will be demonstrated.…”
Section: Integration Of Sag Into Process Flowmentioning
confidence: 99%