2009
DOI: 10.1016/j.apsusc.2009.08.035
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Self-affinity study of nanostructured porous silicon–crystalline silicon interfaces

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Cited by 4 publications
(2 citation statements)
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“…This is a not a complete set of estimators for the self-similarity or LRD parameter (other estimators that are well established in the statistics community include the fractional exponential (FEXP) model [30]). Here, we want to focus on some of the most popular estimators in the physics and geosciences communities (R/S [31][32][33][34][35], DFA [7,[35][36][37], GPH [3,38,39], VB [40] and WL [21,41]).…”
Section: Introductionmentioning
confidence: 99%
“…This is a not a complete set of estimators for the self-similarity or LRD parameter (other estimators that are well established in the statistics community include the fractional exponential (FEXP) model [30]). Here, we want to focus on some of the most popular estimators in the physics and geosciences communities (R/S [31][32][33][34][35], DFA [7,[35][36][37], GPH [3,38,39], VB [40] and WL [21,41]).…”
Section: Introductionmentioning
confidence: 99%
“…Transmission line model though easy to handle lacks the relevant physical justification in addition to this semi-infinite diffusion (Warburg) have no exact corresponding circuit element and specialized elements have to be added. Fractal model of porous structure of DSSCs are proposed [27][28][29][30] in order to comprehend the disorder morphology of such electrodes. In these works a simplified fractal model has been used which fails to identify realistic fractal DSSC with crossover time and length scales.…”
mentioning
confidence: 99%