2020
DOI: 10.1007/s00542-020-04993-5
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Self-encapsulated DC MEMS switch using recessed cantilever beam and anodic bonding between silicon and glass

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Cited by 2 publications
(1 citation statement)
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“…The elements in bonding layer have been identified by the EDS analysis represented in Figure 8. Different elements including C, O, F, S, and Al are clearly identified in the bonding layers, showing that the process of anodic bonding has accompanied by the directional migration of ions driven by a certain temperature and electric fields 45–47 . It can be seen from the Figure 8b that the elements are less distributed in the intermediate bonding layer, which strongly supports our hypothesis about the ineffective bonding of CPEC2 and Al by traditional anodic bonding.…”
Section: Resultssupporting
confidence: 82%
“…The elements in bonding layer have been identified by the EDS analysis represented in Figure 8. Different elements including C, O, F, S, and Al are clearly identified in the bonding layers, showing that the process of anodic bonding has accompanied by the directional migration of ions driven by a certain temperature and electric fields 45–47 . It can be seen from the Figure 8b that the elements are less distributed in the intermediate bonding layer, which strongly supports our hypothesis about the ineffective bonding of CPEC2 and Al by traditional anodic bonding.…”
Section: Resultssupporting
confidence: 82%