2001
DOI: 10.1049/ip-opt:20010843
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Self-heating effects in red (665 nm) VCSELs

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Cited by 11 publications
(8 citation statements)
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“…It can be seen from Fig. 3 that the coupled CM=QW PR lineshape becomes anti-symmetric at 388 K. It can be concluded, therefore, that a VCSEL fabricated from the present wafer would be tuned at approximately 115 C (the ideal continuous wave operating temperature would be slightly less than this, due to the effect of current-induced self-heating [9]). Figure 3 also shows that the centre of the anti-symmetric lineshape at 388 K is located at 760.7 nm.…”
Section: Temperature Dependence Of the Normalincidence Prmentioning
confidence: 74%
“…It can be seen from Fig. 3 that the coupled CM=QW PR lineshape becomes anti-symmetric at 388 K. It can be concluded, therefore, that a VCSEL fabricated from the present wafer would be tuned at approximately 115 C (the ideal continuous wave operating temperature would be slightly less than this, due to the effect of current-induced self-heating [9]). Figure 3 also shows that the centre of the anti-symmetric lineshape at 388 K is located at 760.7 nm.…”
Section: Temperature Dependence Of the Normalincidence Prmentioning
confidence: 74%
“…2(a) in the paper of Knowles et al [12]. Besides, the strong gain-cavity alignment effect [15] is taken into consideration. its thermal conductivity has been given by Adachi [29] and its temperature dependence by Amith et al [30].…”
Section: The Modelmentioning
confidence: 99%
“…[1][2][3] Self-heating is becoming an increasing concern in highfrequency and high-power electronic devices 4 and in optoelectronic devices. 5,6 In these devices, the length-scales are short enough that low-frequency components of the heat-flux deviate seriously from the Fourier law, yet too long for it to be computationally practical to entirely abandon the Fourier law. Despite the fact that the Fourier law is known to dramatically overestimate the heat flux 7 due to ballistic transport (generally by LF modes), it continues to be used in device thermal analysis, occasionally even in cases where it is patently inappropriate to use (e.g., filaments a few nanometers in diameter 8,9 ).…”
Section: Introductionmentioning
confidence: 99%