Self-learning MIMO-RF receiver systems: Process resilient real-time adaptation to channel conditions for low power operation

Banerjee, Debashis; Muldrey, Barry; Sen, Shreyas; Wang, Xian; Chatterjee, Abhijit

doi:10.1109/iccad.2014.7001430

Cited by 10 publications

(1 citation statement)

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“…Adaptation to process variations is also a key issue in other systems such as low-power RF & wireline systems [9][10][11]. In this context, techniques such as self-learning based adaptation [12][13], power-conscious tuning [14] and system level testing and tuning [15][16][17] concepts have been developed. Although a self-tuning approach based on alternative built-in self-test for RF devices has been developed in the past to reduce testing cost and testing time [18][19][20][21], the work reported in this paper develops, for the first time, a testing and self-tuning methodology that avoids the hazards (voltage spikes) associated with standard testing procedures while providing guarantees for the same.…”

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confidence: 99%

A self-tuning architecture for buck converters based on alternative test

Wang

Blanchard

Estella

et al. 2014

2014 International Test Conference

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This paper proposes a self-tuning architecture for buck converters based on a modified alternative "safe" testing approach. It avoids voltage spikes caused by conventional full load testing and provides measurements with strong statistical correlation with the DUT's specifications. The measurements are sampled by a 5-bit ADC and analyzed by on-chip resources for evaluating the DUT specifications and predicting the corresponding values of buck converter tuning knobs to compensate for process variations when standard perfonnances are not met. Thus, the proposed methodology enables self-test and self-tuning of buck converters during production test without the risk of DUT damage during standard production test. The causes of voltage spikes during conventional full load test are discussed both analytically and numerically and the working mechanism of an alternative test procedure is developed. This proposed technique is demonstrated through both simulation and hardware validation experiments.

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