2023
DOI: 10.3390/ma16041497
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Self-Raman 1176 nm Laser Generation from Nd:YVO4 Crystal by Resonator Cavity Coating

Abstract: Crystal coating is an important process in laser crystal applications. According to the crystal characteristics of neodymium-doped yttrium vanadate (Nd:YVO4), its intrinsic parameters, and optical film design theory, Ta2O5 and SiO2 were selected separately as high and low refractive index materials. The optical properties and surface roughness of the films were characterized by OptiLayer and Zygo interferometers, and the effects of ion source bias on refractive index and surface roughness were investigated so … Show more

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“…TiO 2 has a higher refractive index but is prone to oxygen vacancy defects during film formation and generates multivalent oxides due to changes in oxygen charge; the optical constants are greatly affected by the coating environment [ 14 ]. For the melting point to be higher than the sublimation point, ZrO 2 material is directly deposited from the solid phase to the gas phase on the substrate, so there are problems such as unstable evaporation rate and low laser damage threshold [ 15 ]. HfO 2 film has the characteristics of low absorption and high damage threshold, but phase transformation often occurs during evaporation with the sputtering phenomenon, and nodular defects are easily formed on the surface of the film [ 16 ].…”
Section: Methodsmentioning
confidence: 99%
“…TiO 2 has a higher refractive index but is prone to oxygen vacancy defects during film formation and generates multivalent oxides due to changes in oxygen charge; the optical constants are greatly affected by the coating environment [ 14 ]. For the melting point to be higher than the sublimation point, ZrO 2 material is directly deposited from the solid phase to the gas phase on the substrate, so there are problems such as unstable evaporation rate and low laser damage threshold [ 15 ]. HfO 2 film has the characteristics of low absorption and high damage threshold, but phase transformation often occurs during evaporation with the sputtering phenomenon, and nodular defects are easily formed on the surface of the film [ 16 ].…”
Section: Methodsmentioning
confidence: 99%