Self-reference photonic sampling measurement of photodiode chips with microwave de-embedding

Abstract

An improved self-reference photonic sampling method is proposed to measure the frequency response of photodiode (PD) chips. In the proposed scheme, the uneven response of the Mode-Locked Laser Source (MLLS) is eliminated by using the half-frequency photonic sampling measurements. The microwave de-embedding under short-open-load-device termination is used to realize on-chip de-embedding of the adapter network connected to the receiver of the microwave network analyzer in terms of the transmission loss and the impedance mismatch. The proposed on-chip measurement method is free of any extra electro-optical transducer standard, and an accurate measurement can still be realized without an impedance match.