SEM Remote Control with a 3D Option

Abstract

Remote control of a scientific instrument is a topic gaining more and more attention between instrument users and operators. The project presented in this article reports results obtained from two distinct research efforts. The main outcome from the first research was the realization of an application to remote-control a Scanning Electron Microscope (SEM), while the main outcome from the second research was the implementation of a procedure to reconstruct 3D surfaces.