2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) 2019
DOI: 10.1109/etfa.2019.8869359
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Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks

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Cited by 24 publications
(12 citation statements)
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“…Then, as defective cells arise, the trained anomaly model will process the samples and output pixel-wise annotations avoiding the time-consuming data annotation task. After some time, when there are enough annotated defective cell samples, a model will be trained in a supervised manner to search for specific features in the images as in our previous works [ 28 , 29 ], obtaining more accurate models.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Then, as defective cells arise, the trained anomaly model will process the samples and output pixel-wise annotations avoiding the time-consuming data annotation task. After some time, when there are enough annotated defective cell samples, a model will be trained in a supervised manner to search for specific features in the images as in our previous works [ 28 , 29 ], obtaining more accurate models.…”
Section: Methodsmentioning
confidence: 99%
“…In addition to classification, in some cases, the location of the defects in the cells is also provided. For example, in our previous works, we used the sliding window approach with a CNN designed for classification to process cell images by patches and accumulate the results in a heatmap-like image, highlighting areas with a high probability of being defective [ 28 ]. Or we explicitly train a Fully Convolutional Network to perform pixel-wise classification [ 29 ].…”
Section: Related Workmentioning
confidence: 99%
“…The methods for defects detection are generally categorized into Photoluminescence (PL) [11], [12] and Electroluminescence (EL). Since some defects in solar cells only display under EL imaging of photovoltaic modules, most current methods [13], [14] use EL for solar cells' defect detection. Table 1 summarizes relevant literature and methods.…”
Section: B Defect Detectionmentioning
confidence: 99%
“…These defect could result by many accidents throughout the OSC fabrication process, for instance, by scratches, uneven morphologies, and so on. There are many possible variations of intelligent systems which are trained to detect patterns, extract image features or identify defects on a surface 4‐11 However, in general, bulk defects, interface defects, and interconnect defects can generate shunt and series resistance within the cell, contrarily it is yet uncertain the peculiar effect of many kind of defects on the OSC functionality 12‐14 . For that reason it is crucial to implement methodologies for detection, localization, and identification of physical defects, not only during the production cycle, but also at design time.…”
Section: Introductionmentioning
confidence: 99%