2013
DOI: 10.4304/jcp.8.10.2570-2574
|View full text |Cite
|
Sign up to set email alerts
|

Semi-Supervised MEC Clustering Algorithm on Maximized Central Distance

Abstract: In the field of pattern recognition, the traditional supervised learning methods and unsupervised learning methods are not always suitable for the practical applications. In some applications, the data obtained is neither no-information-given nor all-information-given. In addition, the data obtained usually contains some noises due to many interference factors in practical collection procedure and these noises are of great influence on the traditional clustering methods. In order to overcome the two problems m… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2014
2014
2021
2021

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 16 publications
0
1
0
Order By: Relevance
“…In such cases, an algorithm for classification that only exploits positive and unlabeled examples is needed. We call this problem as partially supervised learning or PU learning (learn from positive and unlabeled examples) which is a special case of semi-supervised learning actually [1][2][3].…”
Section: Introductionmentioning
confidence: 99%
“…In such cases, an algorithm for classification that only exploits positive and unlabeled examples is needed. We call this problem as partially supervised learning or PU learning (learn from positive and unlabeled examples) which is a special case of semi-supervised learning actually [1][2][3].…”
Section: Introductionmentioning
confidence: 99%