Semiconducting properties of thermal scales grown on a chromia-forming alloy under controlled oxygen partial pressures

Madi, Y.; Latu-Romain, L.; Mathieu, Sandrine; Parry, Valérie; Petit, Jean‐Pierre; Vilasi, Michel; Wouters, Y.

doi:10.1016/j.corsci.2014.06.029

Cited by 21 publications

(10 citation statements)

References 20 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…4b), which reveals a tiny contribution of unknown semiconducting phase at E < 3 eV. This phase, which cannot be detected by XRD could correspond to n-type (Fe,Cr) 2 O 3 oxides [13]. In Fig.…”

Section: Resultsmentioning

confidence: 88%

“…Photoelectrochemistry (PEC) is a useful technique to identify the nature of the dominant defects by characterizing the semiconductor character (n-or p-type), which can then be used to infer the type of the dominant defects. PEC can be coupled with experiments identifying oxide growth direction such as Automated Crystal Orientation Mapping (ACOM-TEM) ASTAR characterization [13][14][15][16][17][18][19], gold markers and/or isotopic tracer experiments [10,12,20].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Effect of Temperature on the Oxidation Mechanism of Ni-30Cr Alloy

et al. 2021

View full text Add to dashboard Cite

Samples of Ni-30Cr alloy were oxidized at different temperatures from 500 to 900 °C in a nominal oxygen partial pressure of 5 × 10 −6 atm. The parabolic rate constants for growth of the oxide scales, which were confirmed to be chromia, were in agreement with the literature following an Arrhenius law. The semiconductor character of the chromia scale was investigated in order to reveal the nature of the dominant point defects responsible for the diffusion process during oxidation. An n-type semiconductor was found at low temperature (500 °C), and p-type semiconductor at high temperature (900 °C). Our results suggest that oxygen vacancies and chromium vacancies are dominant in grown chromia of n-and p-type, respectively.

show abstract

Section: Resultsmentioning

confidence: 88%

Section: Introductionmentioning

confidence: 99%

Effect of Temperature on the Oxidation Mechanism of Ni-30Cr Alloy

et al. 2021

View full text Add to dashboard Cite

show abstract

“…Moreover, E g values between 2.0 and 3.0 eV were measured for the passive films grown on Fe-Cr alloys in different electrolytic environments and at different electrode potentials. [51][52][53][54][55][56][57][58][59] Ex-situ analytical techniques revealed a Cr(III) content ranging between 20 and 35%. [51][52][53] All these data suggest that passive films with a concentration of Cr between 10 and 40 at% or higher than that present in the starting alloy (≥13% in SS), are formed on Fe-Cr alloys, at different Cr concentration, but all these films display bandgap values larger than that of pure Fe 2 O 3 .…”

Section: Critical Issues In the Fieldmentioning

confidence: 99%

Critical Review—Photocurrent Spectroscopy in Corrosion and Passivity Studies: A Critical Assessment of the Use of Band Gap Value to Estimate the Oxide Film Composition

Quarto

Zaffora

Franco

et al. 2017

J. Electrochem. Soc.

View full text Add to dashboard Cite

A critical assessment of the Photocurrent Spectroscopy (PCS) Technique for the semi-quantitative characterization of passive film and corrosion layers composition is carried out. We take into account more than three decades of PCS usage as "in-situ" analytical technique and related results as well as the criticism of the underlying semi-empirical correlation relating the measured optical bandgap (E g ) to the passive film composition. The discrepancies between the experimental data, gathered by PCS measurements, and E g estimates originating from recently developed Density Functional Theory based modeling of solid state properties are stressed with particular emphasis on the case of anodic passive film grown on technologically important alloys (Fe-Cr and stainless steels). The extension of this correlation to mixed oxides and its use for relating the oxide composition to the bandgap values is critically reviewed by comparing the predicted E g of mixed oxides with the experimental values. Suggestions on how to account for different bandgap values of oxide polymorphs and how to correlate the E g values to the composition of mixed s,p-d-metal oxides are presented and discussed on the basis of experimental results reported in the literature. On the basis of this assessment, the ability of PCS in providing quantitative information on the composition of passive film and corrosion layer is generally confirmed. Fujimoto (fujimoto@mat.eng.osaka-u.ac.jp) and HeeJin Jang (heejin@chosun.ac.kr). . This paper is a Critical Review in Electrochemical and Solid State Science and Technology (CRES 3 T). This article was reviewed by ShinjiPhotocurrent Spectroscopy (PCS) is currently employed for the characterization of solid-state properties of semiconducting and insulating materials, since the knowledge of their bandgap is a prerequisite to any possible application in different fields such as solar energy conversion (photoelectrochemical and photovoltaic solar cells, photocatalysis) and microelectronics (high-k, high band-gap materials). 1,2In the last 20-30 years an increasing number of electrochemists working in the field of corrosion have been attracted by this technique owing to its versatility and ability to scrutinize "in-situ" corrosion layers and passive films having semiconducting or insulating behavior. In previous as well as in very recent works 3-7 we have shown that PCS is able to provide detailed information on characteristic energy levels of passive film/electrolyte junctions (flatband potential: U FB ; internal photoemission threshold: E th ; bandgap value: E g ). Such information is necessary for a deeper understanding of the possible mechanisms of charge transfer (electrons and ions) at the metal/corrosion layer/electrolyte interface. Further advantages stem from the fact that the PCS technique does not require particular surface finishing control, it can be used both on large areas as well as in microscopic regions of the electrode, and can reach high sensitivity by using a lock-in amplifier coupled to a mec...

show abstract

“…These regions correspond certainly to the presence in the scale of different conducting phases. Low-energy region could correspond to n-type (Fe,Cr) 2 O 3 oxides [21]. This phase was not detected by Raman spectroscopy, but it must be recalled that PEC is Oxidation of Metals (2021) 96:31-41 a very sensitive technique.…”

Section: Methodsmentioning

confidence: 97%

Modeling of Trilayered Oxide Thermally Grown on 441 Ferritic Stainless Steel at 900 °C in Synthetic Air

Roy

Latu-Romain

Guillotte³

et al. 2021

Oxid Met

View full text Add to dashboard Cite

Ferritic stainless steel (AISI 441) oxidation was studied at 900 °C in synthetic air. At short time of oxidation (3 min), the oxide scale is comprised of chromia including some MnCr 2 O 4 nodules (of a few tens of nanometers in diameter) and exhibits n-type conduction. Later, after 10 h, a trilayered morphology was observed with an internal equiaxed chromia, an intermediate columnar chromia and a top covering spinel layer. A model for oxide scale growth has been developed in this paper, taking into account all experimental observations and earlier studies.

show abstract

Semiconducting properties of thermal scales grown on a chromia-forming alloy under controlled oxygen partial pressures

Cited by 21 publications

References 20 publications

Effect of Temperature on the Oxidation Mechanism of Ni-30Cr Alloy

Effect of Temperature on the Oxidation Mechanism of Ni-30Cr Alloy

Critical Review—Photocurrent Spectroscopy in Corrosion and Passivity Studies: A Critical Assessment of the Use of Band Gap Value to Estimate the Oxide Film Composition

Modeling of Trilayered Oxide Thermally Grown on 441 Ferritic Stainless Steel at 900 °C in Synthetic Air

Contact Info

Product

Resources

About