2001
DOI: 10.1021/ma010853r
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Semicrystalline Lamellar Phase in Binary Mixtures of Very Long Chain n-Alkanes

Abstract: Lamellar structure formed by melt crystallization of binary mixtures of monodisperse long n-alkanes C122H246, C162H326, C194H390, C210H422, C246H494, C258H518, and C294H590 was studied by small-angle X-ray scattering (SAXS) and thermal analysis. A semicrystalline form (SCF) was found to be the stable phase over a wide range of compositions in the temperature range between the melting points of the shorter alkane and that of the alkane with a length equal to the difference between the chain lengths of the two c… Show more

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Cited by 21 publications
(34 citation statements)
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“…3), as well as with increasing proportion of the longer alkane in the mixture [17]. The semicrystalline form (SCF) is found in a broad range of compositions with molar fraction of the shorter alkane between ഠ0.5 and 1.…”
mentioning
confidence: 96%
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“…3), as well as with increasing proportion of the longer alkane in the mixture [17]. The semicrystalline form (SCF) is found in a broad range of compositions with molar fraction of the shorter alkane between ഠ0.5 and 1.…”
mentioning
confidence: 96%
“…A clear transition occurs at around 105 ± C with melting at 130 ± C. Wide-angle scattering (WAXS) shows the crystal unit cell to be that of polyethylene [16], remaining unchanged in the transition. An identical but temperature-shifted reverse series of diffractograms is obtained on cooling the sample from the melt at 2 ± C min 21 ; the temperature of both transitions is lowered by 10 ± C [17]. Similar behavior is observed in a wide range of compositions, as well as in other binary mixtures involving alkanes C 122 H 246 , C 162 H 326 , C 194 H 390 , C 210 H 422 , C 246 H 494 , C 258 H 518 , and C 294 H 590 .…”
mentioning
confidence: 97%
“…[11]. The beam was monochromatized and doublefocused onto the detector having a cross-section of 2 £ 0.3 mm 2 in the sample plane.…”
Section: Saxsmentioning
confidence: 99%
“…The electron density profile can thus be directly reconstructed from the diffraction pattern via Eq. [11,12] High Temperature Form Figure 1 shows a series of SAXS diffractograms recorded during heating of the 50:50 w/w mixture of C 194 H 390 and C 294 H 590 at 58C/min.…”
Section: Reconstruction Of Electron Density Profilesmentioning
confidence: 99%
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