2006
DOI: 10.1016/j.sna.2005.08.019
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Sensor properties and surface characterization of the metal-deposited SPR optical fiber sensors with Au, Ag, Cu, and Al

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Cited by 181 publications
(110 citation statements)
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“…The multilayer is made of a Ag, a SiO 2 and a Pd layer. Ag is chosen since it is well known as a good candidate for SPR sensors [19]. The Ag layer can be replaced by a Au layer -to avoid the oxidation during the fabrication -or any other metal such as Al or bi-metal [20].…”
Section: Simulation Modelmentioning
confidence: 99%
“…The multilayer is made of a Ag, a SiO 2 and a Pd layer. Ag is chosen since it is well known as a good candidate for SPR sensors [19]. The Ag layer can be replaced by a Au layer -to avoid the oxidation during the fabrication -or any other metal such as Al or bi-metal [20].…”
Section: Simulation Modelmentioning
confidence: 99%
“…[7] is the SPR term derived by Xu et al (Eq. [9]) and the left-hand term is the Fresnel equation for reflection off of the retro-reflector for TM mode light as a function of incident angle. This term is raised to the 2N rather than N power as in Eq.…”
Section: Theorymentioning
confidence: 99%
“…The exposed core is then coated with an SPR supporting metal and the sensor is used in a single-pass configuration. 7,8,9 A fundamental difference between an optical fiber and the common Kretschmann configuration is that in a multimode optical fiber, the allowed incident angles are a continuum from the critical angle of the fiber as set by the numerical aperture to /2 from normal. As has been demonstrated both experimentally and theoretically, this has the effect of significantly broadening the SPR peak.…”
Section: Introductionmentioning
confidence: 99%
“…49 Furthermore, we also fabricated metal-deposited optical fiber sensors using Cu and Al and reported the response curves and sensor properties for the first time. 50 The sensor properties of Al-deposited and Ag-deposited SPR optical fibers were studied thoroughly along with the surface characterization of these metal films by atomic force microscopy and X-ray photoelectron spectroscopy. 51,52 These sensors promise the development of a new analytical technique for use in SPR sensing applications.…”
Section: Introductionmentioning
confidence: 99%