Sensorless Implementation of a PPF Controller for Active &lt;inline-formula&gt; &lt;tex-math notation="TeX"&gt;$Q$ &lt;/tex-math&gt;&lt;/inline-formula&gt; Control of an AFM Microcantilever

Fairbairn, Matthew W.; Müller, Philipp; Moheimani, S. O. Reza

doi:10.1109/tcst.2014.2303486

Cited by 11 publications

(5 citation statements)

References 27 publications

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“…unless x k = 0. In the case that x k = 0, we also have x k = 0 according to (43). Hence, the system state already stays at the equilibrium at the origin.…”

Section: Discrete-time Integral Resonant Controllermentioning

confidence: 98%

“…Several popular SNI controllers, including the positive position feedback (PPF) controller [38]- [43], the resonant controller (RC) [13], [14], [44], [45], and the integral resonant controller (IRC) [6], [46]- [48], have been implemented successfully. These controllers are not only easy to implement but also highly effective in terms of providing robust damping, especially when dealing with uncertainties in resonance frequency [38].…”

Section: Introductionmentioning

confidence: 99%

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A negative imaginary approach to hybrid integrator-gain system control

Shi

Nikooienejad

Petersen

et al. 2022

2022 IEEE 61st Conference on Decision and Control (CDC)

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We propose a discrete-time integral resonant control (IRC) approach for negative imaginary (NI) systems, which overcomes several limitations of continuous-time IRC. We show that a discrete-time IRC has a step-advanced negative imaginary property. A zero-order hold-sampled NI system can be asymptotically stabilized using a discrete-time IRC with suitable parameters. A hardware experiment is conducted where a highspeed flexure-guided nanopositioner is efficiently damped using the proposed discrete-time IRC with the discrete-time controller being implemented in FPGA hardware at the sampling rate of 1.25 MHz.

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“…unless x k = 0. In the case that x k = 0, we also have x k = 0 according to (43). Hence, the system state already stays at the equilibrium at the origin.…”

Section: Discrete-time Integral Resonant Controllermentioning

confidence: 98%

Section: Introductionmentioning

confidence: 99%

A negative imaginary approach to hybrid integrator-gain system control

Shi

Nikooienejad

Petersen

et al. 2022

2022 IEEE 61st Conference on Decision and Control (CDC)

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“…To increase the scanning speed of an AFM by reducing the cantilever's Q factor, an active impedance in the piezoelectric shunt control framework is proposed in [126]. By using this technique, scans are obtained on a 10 µm × 10 µm section of a calibration grating at a scanning speed of 60 µm/s.…”

Section: ) Compensate the Limitation Of Probementioning

confidence: 99%

Improvement in the Imaging Performance of Atomic Force Microscopy: A Survey

Rana

Pota

Petersen

2017

IEEE Trans. Automat. Sci. Eng.

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Nanotechnology is the branch of science which deals with the manipulation of matters at an extremely high resolution down to the atomic level. In recent years atomic force microscopy (AFM) has proven to be extremely versatile as an investigative tool in this field. The imaging performance of AFMs is hindered by: (i) the complex behavior of piezo materials, such as vibrations due to the lightly damped low-frequency resonant modes, inherent hysteresis and creep nonlinearities; (ii) the crosscoupling effect caused by the piezoelectric tube scanner (PTS); (iii) the limited bandwidth of the probe; (iv) the limitations of the conventional raster scanning method using a triangular reference signal; (v) the limited bandwidth of the proportionalintegral (PI) controllers used in AFMs; (vi) the offset, noise, and limited sensitivity of position sensors and photodetector; and(vii) limited sampling rate of AFM's measurement unit. Due to these limitations, an AFM has a high spatial but low temporal resolution, i.e., its imaging is slow, e.g., an image frame of a living cell takes up to 120 s, which means that rapid biological processes that occur in seconds cannot be studied using commercially available AFMs. There is a need, to perform fast scans using an AFM with nanoscale accuracy. This paper presents a survey of the literature, presents an overview of a few emerging innovative solutions in AFM imaging, and finally proposes future research directions. Note to Practitioners→ An atomic force microscope (AFM)is a scientific instrument capable of investigating, controlling, and manipulating matter on a nanoscale. It is a fundamental part of research in the field of nanotechnology because of its capability to obtain 3D images of specimens in the areas of life sciences and materials science. However, the imaging performances of currently available AFMs are restricted by some limitations which, during the last two decades, several works have attempted to overcome in order to meet present demands. This article presents an overview of developments in AFM imaging, emphasizing the key roles of: the modeling, control techniques, and mechanical structural designs of an AFM's piezoelectric tube scanner (PTS) and probe; different scanning methods; and sensor noise compensation techniques.

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“…Here, a force proportional to the oscillation velocity of the beam was applied to the sensor. Although measuring velocity [ 27 , 38 ] is preferable, methods based on measuring deflection, such as differentiation [ 13 ], phase-shifting [ 20 ], time delay [ 16 ], resonant control [ 22 ], observer-based control [ 39 ], and positive position feedback [ 24 , 26 ], are also viable. In general, the effectiveness of closed-loop Q control decreases with the increasing integration level of the sensor.…”

Section: Introductionmentioning

confidence: 99%

Damped Cantilever Microprobes for High-Speed Contact Metrology with 3D Surface Topography

Fahrbach

Nyang’au

et al. 2023

Sensors

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We addressed the coating 5 mm-long cantilever microprobes with a viscoelastic material, which was intended to considerably extend the range of the traverse speed during the measurements of the 3D surface topography by damping contact-induced oscillations. The damping material was composed of epoxy glue, isopropyl alcohol, and glycerol, and its deposition onto the cantilever is described, as well as the tests of the completed cantilevers under free-oscillating conditions and in contact during scanning on a rough surface. The amplitude and phase of the cantilever’s fundamental out-of-plane oscillation mode was investigated vs. the damping layer thickness, which was set via repeated coating steps. The resonance frequency and quality factor decreased with the increasing thickness of the damping layer for both the free-oscillating and in-contact scanning operation mode, as expected from viscoelastic theory. A very low storage modulus of E′≈100kPa, a loss modulus of E″≈434kPa, and a density of ρ≈1.2gcm−3 were yielded for the damping composite. Almost critical damping was observed with an approximately 130 µm-thick damping layer in the free-oscillating case, which was effective at suppressing the ringing behavior during the high-speed in-contact probing of the rough surface topography.

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Sensorless Implementation of a PPF Controller for Active <inline-formula> <tex-math notation="TeX">$Q$ </tex-math></inline-formula> Control of an AFM Microcantilever

Cited by 11 publications

References 27 publications

A negative imaginary approach to hybrid integrator-gain system control

A negative imaginary approach to hybrid integrator-gain system control

Improvement in the Imaging Performance of Atomic Force Microscopy: A Survey

Damped Cantilever Microprobes for High-Speed Contact Metrology with 3D Surface Topography

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