2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) 2020
DOI: 10.1109/i2mtc43012.2020.9128537
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Separation of Overlapping Reflected Signals in Stepped-Frequency Waveform Reflectometry

Nicola Giaquinto
1
,
Marco Scarpetta
2
,
Maurizio Spadavecchia
3
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