Sequential Cycloid Scanning for Time-resolved Atomic Force Microscopy

Nikooienejad, Nastaran; Alipour, Atefeh; Maroufi, Mohammad; Moheimani, S. O. Reza

doi:10.1109/aim.2018.8452302

Cited by 1 publication

(7 citation statements)

References 15 publications

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“…A number of nonlinearities are also produced in triangular waveform such as creep, hysteresis etc. that distort the scanning image of the surface of the sample [24], [25].…”

Section: A Raster Scanning Methodsmentioning

confidence: 99%

“…These are overcome by CLV that increases the scanning speed and provides uniform resolution of the image. But, initially it is suffered by high angular frequency [24], [25], [52].…”

Section: Spiral Scanning Methodsmentioning

confidence: 99%

“…It is important to keep the frequency of both signal equal with a slow ramp. The scanning technique can produce high quality image at high scanning speed without the need of any special tools or the damping mode of the scanner [25]. The horizontal distance between the scan lines are always fixed and the center of the scan area is scanned twice.…”

Section: E Cycloid Scanning Methodsmentioning

confidence: 99%

“…The triangular wave consists of all odd harmonics of the fundamental frequency that reduces the scanning speed of the AFM to 1% of the resonant frequency of the scanning unit. To improve the scanning speed of the AFM, different scanning methods are introduced such as sinusoidal [23], rotational [48], spiral [24], cycloid [25], and lissajous scanning method [26]. These techniques overcome the limitations of the raster scanning method.…”

Section: Introductionmentioning

confidence: 99%

“…Reference [30] presents a survey on the behavior and working methods of piezoelectric actuators against different nonlinearities. The relationship between the scanning speed and sampling frequency are listed in [21], [25].…”

Section: Introductionmentioning

confidence: 99%

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Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review

et al. 2019

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The invention of the nanotechnology adds a new branch to investigate and control the physical properties of matters at atomic level. The aim of this technology is to image the characteristics of metals, biological organs, and polymers. Scanning probe microscopy (SPM) opens a new branch to analysis the atomic properties of the matters. Atomic force microscopy (AFM), a branch of SPM, is a versatile tool of nanotechnology to image both conductive and non-conductive matters with high resolution. Commercial AFM uses raster scanning technique to produce image of the matters that is responsible for low scanning speed and image quality. The performances of AFM are hampered due to low bandwidth of the scanning unit and vertical Proportional-Integral (PI) controller and may damage the surface of the samples. Different nonraster scanning techniques such as sinusoidal, rotational, spiral, cycloid, and lissajous scanning have been proposed to overcome the limitations of raster scanning method by providing high scanning speed, image quality, and resolution. This paper presents a survey of raster and non-raster scanning methods for high speed AFM and provides a compression between them in term of scanning speed, bandwidth and highest achievable scanning frequency. The control techniques applied to the AFM for improving raster, sinusoidal, spiral, cycloid, and lissajous scanning methods are studied in this paper to find most optimum scanning technique for AFM. INDEX TERMS Atomic force microscopy, raster scanning method, sinusoidal scanning method, rotational scanning method, spiral scanning method, cycloid scanning method, Lissajous scanning method, scanning speed, resolution.

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“…A number of nonlinearities are also produced in triangular waveform such as creep, hysteresis etc. that distort the scanning image of the surface of the sample [24], [25].…”

Section: A Raster Scanning Methodsmentioning

confidence: 99%

“…These are overcome by CLV that increases the scanning speed and provides uniform resolution of the image. But, initially it is suffered by high angular frequency [24], [25], [52].…”

Section: Spiral Scanning Methodsmentioning

confidence: 99%

Section: E Cycloid Scanning Methodsmentioning

confidence: 99%