Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI
DOI: 10.1109/asmc.2003.1194471
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Setting performance targets in a 300 mm wafer fabrication facility

Abstract: time that can be spent on leaming the new processes. A Evaluation of fab performance during the ramp-up phase is important since sufficient time should be allowed to develop processes with the designed specifications while productivity has to be maintained at a desired level to meet the ramp schedule. Setting targets for production in such an environment is an important task. Daily production targets help answer the question of whether the fab is performing as well as it should be, given the operating conditio… Show more

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Cited by 3 publications
(3 citation statements)
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“…This approach effectively breaks the problem down into manageable chunks that can be solved independently but are tightly linked. While there exists considerable literature on semiconductor production scheduling and dispatching as noted above, there is limited work on targeting [1], [8] which is critical to solving the end-to-end semiconductor manufacturing work-in-process (WIP) operations management problem.…”
Section: Introductionmentioning
confidence: 99%
“…This approach effectively breaks the problem down into manageable chunks that can be solved independently but are tightly linked. While there exists considerable literature on semiconductor production scheduling and dispatching as noted above, there is limited work on targeting [1], [8] which is critical to solving the end-to-end semiconductor manufacturing work-in-process (WIP) operations management problem.…”
Section: Introductionmentioning
confidence: 99%
“…In the literature, there are few studies considering the WIP projection problem in the semiconductor industry ( [46], [47], [48]). In these works, authors consider different objectives and do not take into account all the cited constraints.…”
Section: Previous Related Workmentioning
confidence: 99%
“…Lee et al [47] employed deterministic linear programming techniques for the WIP projection problem in the wafer fab, that explicitly considers the variable cycle time. Govind and Fronckowiak [48] consider WIP projection problem to measure production performance at IBM's 300 mm wafer fab by computing productivity and WIP targets at infinite capacity. As one can see, even if some papers tackle similar planning problems, none of the already proposed models explicitly address our specific problem.…”
Section: Previous Related Workmentioning
confidence: 99%