Setup for measurements of partial ion yields at the Synchrotron Radiation Center

Wehlitz, R.; Koncz, Cs.; Sellin, I. A.

doi:10.1063/1.1425389

Cited by 31 publications

(11 citation statements)

References 11 publications

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“…An ion time-of-flight spectrometer with pulsed extraction field 25,26 was used on the variable line spacing plane grating monochromator (VLS-PGM) beamline at Wisconsin's Synchrotron Radiation Center. 27 Xe was taken from a compressed gas cylinder, and the 5 mbar vapor pressure of XeF 2 was used from the solid at room temperature.…”

Section: Experimental Methodsmentioning

confidence: 99%

Inner-shell photoionization and core-hole decay of Xe and XeF2

Southworth

Wehlitz

Picón

et al. 2015

The Journal of Chemical Physics

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Photoionization cross sections and partial ion yields of Xe and XeF2 from Xe 3d(5/2), Xe 3d(3/2), and F 1s subshells in the 660-740 eV range are compared to explore effects of the F ligands. The Xe 3d-ϵf continuum shape resonances dominate the photoionization cross sections of both the atom and molecule, but prominent resonances appear in the XeF2 cross section due to nominal excitation of Xe 3d and F 1s electrons to the lowest unoccupied molecular orbital (LUMO), a delocalized anti-bonding MO. Comparisons of the ion products from the atom and molecule following Xe 3d photoionization show that the charge-state distribution of Xe ions is shifted to lower charge states in the molecule along with production of energetic F(+) and F(2+) ions. This suggests that, in decay of a Xe 3d core hole, charge is redistributed to the F ligands and the system dissociates due to Coulomb repulsion. The ion products from excitation of the F 1s-LUMO resonance are different and show strong increases in the yields of Xe(+) and F(+) ions. The subshell ionization thresholds, the LUMO resonance energies, and their oscillator strengths are calculated by relativistic coupled-cluster methods and agree well with measurements.

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Section: Experimental Methodsmentioning

confidence: 99%

Inner-shell photoionization and core-hole decay of Xe and XeF2

Southworth

Wehlitz

Picón

et al. 2015

The Journal of Chemical Physics

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“…An ion time-of-flight spectrometer, operating in the pulsed-extraction mode, separated the ions of different mass-to-charge ratios [23]. The pulse period was 0.1 ms so that only long-lived metastable or fully stable ions were detected.…”

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confidence: 99%

Large Molecules Reveal a Linear Length Scaling for Double Photoionization

et al. 2012

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We have measured the ratio of doubly to singly charged parent ions of benzene, naphthalene, anthracene, and pentacene using monochromatized synchrotron radiation up to 30 eV above the corresponding threshold. Our measurements show a striking similarity between the ratio of doubly charged to all parent ions and the ratio for helium. Moreover, the magnitudes of the ratios for these molecules scale linearly with their lengths with an amazing accuracy. A high ratio, i.e., a high relative double-photoionization probability, makes a molecule an important source of low-energy electrons that can promote radiation damage of biomolecules [B. Boudaïffa et al., Science 287, 1658 (2000)].

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“…The temperature of the oven was typically 372 C, which is lower than in experiments of other authors. The ions created were extracted by a pulsed electric field across the interaction region, accelerated into a drift tube, and detected by a Z stack of microchannel plates [20]. By measuring the ions' flight time, we obtained yields for the singly and multiply charged C 60 ions and their fragments.…”

mentioning

confidence: 99%

“…Details of the experimental setup can be found in Ref. [20]. Various ionyield scans across resonances in Ne, Ar, Kr, and Xe served as photon energy calibration.…”

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confidence: 99%

Experimental Evidence for Modulations in the Relative Double-Photoionization Cross Section ofC60from Threshold up to 280 eV

Juranić¹,

Barger

Wehlitz³

2006

Phys. Rev. Lett.

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The relative double-photoionization cross section of neutral C60 clusters was investigated using monochromatized synchrotron radiation between 18 and 283 eV. Our measurement of the double-to-single photoionization ratio reveals two modulating components that are superimposed on a smooth ratio curve from threshold (19.0 eV) up to 280 eV, when inner-shell excitations become possible. The maxima in the modulation can be related to geometrical dimensions of the C60 cluster.

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Setup for measurements of partial ion yields at the Synchrotron Radiation Center

Cited by 31 publications

References 11 publications

Inner-shell photoionization and core-hole decay of Xe and XeF2

Inner-shell photoionization and core-hole decay of Xe and XeF2

Large Molecules Reveal a Linear Length Scaling for Double Photoionization

Experimental Evidence for Modulations in the Relative Double-Photoionization Cross Section ofC60from Threshold up to 280 eV

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