2002
DOI: 10.1109/tns.2002.1039664
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SEU measurements and predictions on MPTB for a large energetic solar particle event

Abstract: Single-event upset (SEU) ground testing and rate calculations have been performed for 16-Mb DRAMs flown on the microelectronics and photonics testbed experiment (MPTB) using measured particle spectra and compared with space data from a period of high solar activity. The results show that with the measured spectra, the measurements agree quite well with the calculations. Using just modeled environments, the results do not agree as well.

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Cited by 15 publications
(8 citation statements)
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“…The microelectronics and photonics test bed (MPTB) carried a number of technology demonstration experiments. Among these was a series of SRAMs (static random access memory) and DRAMs (dynamic random access memory) provided by Naval Research Lab [Campbell et al, 2002]. These memory devices were reset and polled at high frequency to detect single-event upsets (SEUs; bit flips).…”
Section: Single-event Effects (Solar Particle Events)mentioning
confidence: 99%
“…The microelectronics and photonics test bed (MPTB) carried a number of technology demonstration experiments. Among these was a series of SRAMs (static random access memory) and DRAMs (dynamic random access memory) provided by Naval Research Lab [Campbell et al, 2002]. These memory devices were reset and polled at high frequency to detect single-event upsets (SEUs; bit flips).…”
Section: Single-event Effects (Solar Particle Events)mentioning
confidence: 99%
“…The Cosmic Ray Research Satellite (CRRES) [74], circa 1980 (no longer active), and Microelectronics and Photonics Test Bed (MPTB) [75], circa 1998 (still active), are two major spaceflight instruments that contain SEE experiments. These experiments have been vital to the validation of the traditional SEE rate prediction approaches, as well as other radiation effects research.…”
Section: Discussionmentioning
confidence: 99%
“…(123,124) Energetic electrons trapped in the outer radiation belt cause electrostatic charging and discharging, which can damage sensitive electronic equipment and solar panels. (125)(126)(127)(128)(129) SEPs can cause displacement damage (reducing device performance) and single event effects (SEEs), (130)(131)(132) which are a growing issue as devices are miniaturized. (17) During the 2003 Halloween storms, 47 satellites reported anomalies (out of 450 in orbit, i.e., ß10%), one scientific satellite was lost, and 10 satellites lost operational service for more than one day.…”
Section: Satellite Infrastructurementioning
confidence: 99%