In this paper, we present a technique to maximize the lifetime of SRAM-based FPGAs in space mission. We focus on recovering permanent faults induced by SEE (single-events effect). In our technique, we use a fix-sized fault detection module to detect permanent faults and propose a permanent fault recovery mechanism for fault recovery. By using partial reconfiguration, we develop a system lifetime estimation model to find the optimal partition for designing the module-based fault recovering with the maximum system lifetime. We conduct experiments with a set of real applications including SpaceWire, Wavelet, AC97, MEPG-4, 8086, and Ethernet on Xilinx XUP platforms. The experimental results show our technique can effectively improve the lifetime compared with the previous work.