2020
DOI: 10.1117/1.oe.59.1.014107
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Shape defect measurement by fringe projection profilometry and phase-shifting algorithms

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Cited by 8 publications
(3 citation statements)
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“…Once pc is determined, it becomes straightforward to find the position of p, and the normal vector n(p) can then be determined by Eq. (7).…”
Section: Fig 2 Light Propagation Process Under Led Illuminationsmentioning
confidence: 99%
See 1 more Smart Citation
“…Once pc is determined, it becomes straightforward to find the position of p, and the normal vector n(p) can then be determined by Eq. (7).…”
Section: Fig 2 Light Propagation Process Under Led Illuminationsmentioning
confidence: 99%
“…Unfortunately, its performance is limited since the commonly encountered metallic surfaces are textureless. With the advancements in active 3D measurement accuracy, the structure light reconstruction method [7] and deflectometry method [8] gain popular because of their simple hardware which only consist of several cameras and a projector. These methods rebuild the surface by projecting pattern on the object and determining the phase-shape mapping relationship.…”
Section: Introductionmentioning
confidence: 99%
“…MFPP finds common applications in high-precision automatic optical inspection (AOI) and three-dimensional measurement equipment 1 . Compared to conventional FPP, MFPP is more suitable for precision measurement requirements in various fields, including electronic products 2 , shape defect 3 , surface mounted technology (SMT) inspection 4 , and ball grid array packaging 5 .…”
Section: Introductionmentioning
confidence: 99%