2016
DOI: 10.1007/s10470-016-0841-y
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Short critical area model and extraction algorithm based on defect characteristics in integrated circuits

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Cited by 3 publications
(2 citation statements)
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“…Specifically, defect detection employing a conventional deep neural network (DNN) can be applied for pattern recognition and classification. In the detection tasks, the defect points to be processed are much smaller, typically containing approximately one to seven pixels, but they are analyzed in an image consisting of 1024 × 1024 pixels or even more [3] . This poses a great challenge for automatic inspection.…”
Section: Introductionmentioning
confidence: 99%
“…Specifically, defect detection employing a conventional deep neural network (DNN) can be applied for pattern recognition and classification. In the detection tasks, the defect points to be processed are much smaller, typically containing approximately one to seven pixels, but they are analyzed in an image consisting of 1024 × 1024 pixels or even more [3] . This poses a great challenge for automatic inspection.…”
Section: Introductionmentioning
confidence: 99%
“…Corrosion and fatigue damage occur in daily applications, thus increasing production costs and causing considerable wasted resources and economic opportunities [1]. Defect detection technology has achieved favorable results in areas, such as pipelines [2.3], electronic components [4]- [6], parts [7]- [9], fault diagnosis [10.11] and others [12.13]. However, research on the defect detection of tiny parts, particularly the literature on real-time defect detection of tiny parts in conveyor belts, has remained scarce.…”
Section: Introductionmentioning
confidence: 99%