2011
DOI: 10.1016/j.jnoncrysol.2011.02.005
|View full text |Cite
|
Sign up to set email alerts
|

Short-range order evolution in S-rich Ge–S glasses by X-ray photoelectron spectroscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
11
0
3

Year Published

2014
2014
2024
2024

Publication Types

Select...
6

Relationship

2
4

Authors

Journals

citations
Cited by 20 publications
(16 citation statements)
references
References 26 publications
2
11
0
3
Order By: Relevance
“…3(b), indicating asymmetric peaks at about 54.8 eV and 54.0 eV [37], corresponding to the reported values for the binding energies of Se 3d 3/2 and Se 3d 5/2 , respectively. The peak separation energy of 0.8 eV and the spin-orbit split peak doublet of area of 2:3 between 3d spectra is consistent with a previous report [38]. Other double peaks at 158.7 eV and 164.0 eV are from Bi 4f 7/2 and 4f 5/2 [39], respectively, as shown in Fig.…”
Section: Resultssupporting
confidence: 91%
“…3(b), indicating asymmetric peaks at about 54.8 eV and 54.0 eV [37], corresponding to the reported values for the binding energies of Se 3d 3/2 and Se 3d 5/2 , respectively. The peak separation energy of 0.8 eV and the spin-orbit split peak doublet of area of 2:3 between 3d spectra is consistent with a previous report [38]. Other double peaks at 158.7 eV and 164.0 eV are from Bi 4f 7/2 and 4f 5/2 [39], respectively, as shown in Fig.…”
Section: Resultssupporting
confidence: 91%
“…XPS has been successfully exploited to determine the structure of a broad range of binary and ternary chalcogenide glass systems, such as As-S, As-Se, Ge-S, Ge-Se, As-Ge-Se, including the chemical environments of the constituent elements [21][22][23][24][25]. It has been used primarily to investigate the structure of thermally evaporated ChG thin films [8,[26][27][28], while such structural information is not available for SCF.…”
Section: Introductionmentioning
confidence: 99%
“…High-resolution XPS spectra were recorded with a Scienta ESCA-300 spectrometer using monochromatic Al Kα X-rays (1486.6 eV) under a vacuum of 2 Â 10 À8 Torr (or less), as described elsewhere. [17][18][19][20][21][22][23][24] To obtain structural information about the bulk of glass, the samples were fractured directly in the ultrahigh-vacuum chamber of the spectrometer and the data were collected from these freshly created surfaces. A low energy (<10 eV) electron flood gun was used to neutralize surface charging that resulted from the photoelectron emission.…”
Section: Methodsmentioning
confidence: 99%
“…High-resolution X-ray photoelectron spectroscopy (XPS) is an appropriate tool for this purpose, successfully applied previously to explain structural development in many binary and ternary glasses (e.g., As─Se, Ge─Se, As─S, Ge─S, As─Ge─Se, Ga─Ge─Se, Ge─Sb─Se, and Ga─Ge─Sb─S). [17][18][19][20][21][22][23][24] It allows not only to identify the main building blocks at the short-range order of glass networks, but also to quantify their moieties.…”
Section: Introductionmentioning
confidence: 99%