2024
DOI: 10.1073/pnas.2401246121
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Shot noise-mitigated secondary electron imaging with ion count-aided microscopy

Akshay Agarwal,
Leila Kasaei,
Xinglin He
et al.

Abstract: Modern science is dependent on imaging on the nanoscale, often achieved through processes that detect secondary electrons created by a highly focused incident charged particle beam. Multiple types of measurement noise limit the ultimate trade-off between the image quality and the incident particle dose, which can preclude useful imaging of dose-sensitive samples. Existing methods to improve image quality do not fundamentally mitigate the noise sources. Furthermore, barriers to assigning a physically meaningful… Show more

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