The
effects of RbF postdeposition treatment (RbF-PDT) on Cu(In,Ga)Se2, CuInSe2, and CuGaSe2 thin films and
solar cell devices are comparatively studied. Similar to the effect
of the KF postdeposition treatment (KF-PDT), Cu(In,Ga)Se2 and CuInSe2 film surfaces show significant pore formation
resulting in a rough surface morphology with RbF-PDT, whereas this
is not the case for In-free CuGaSe2. The device properties
of the In-containing and In-free Cu(In,Ga)Se2 solar cells
also show contrasting results, namely, Cu(In,Ga)Se2 or
CuInSe2 devices show an increase in the open circuit voltage
(V
oc) and fill factor (FF) values and
almost constant or a slight decrease in the short-circuit current
density (J
sc) values with RbF-PDT, whereas
CuGaSe2 devices show no significant improvements in the V
oc and FF values but a substantial increase
in the J
sc values. These results suggest
that the alkali effects on the Cu(In,Ga)Se2 film and device
properties strongly depend on the group III elemental composition
in the Cu(In,Ga)Se2 films as well as alkali-metal species.