This review paper presents the applications of x-ray diffraction to routine measurements and the procedures for extending its capabilities of analysis to undertake a detailed structural investigation of low-dimensional structures. The uses and limitations of the familiar double-crystal diffractometer are discussed as are the advantages of 'reciprocal space mapping' with a multiple-crystal diffractometer. In general x-ray diffraction has been used for composition and thickness measurement in low-dimensional structures (us) and these aspects are covered, as well as the avoidance of the piifalls associated with their determination. The possibilities for the use of x-ray diffraction methods to determine interface quality, the evolution of lattice relaxation, the detailed microstructure, etc, are discussed, with an indication of the limits of the techniques.
P F Fewster
Aspects to considerThis section discusses some very general points that should be considered before any analysis using x-ray diffraction techniques.