2010 International Workshop on Junction Technology Extended Abstracts 2010
DOI: 10.1109/iwjt.2010.5474972
|View full text |Cite
|
Sign up to set email alerts
|

Sidewall resistance reduction for FinFETs by B<inf>2</inf>H<inf>6</inf>/Helium Self-Regulatory Plasma Doping process

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 6 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?