1982
DOI: 10.1109/tns.1982.4336332
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Signal Processing for Semiconductor Detectors

Abstract: This is a tutorial paper designed to provide a ; balanced perspective on the processing of signals produced by semiconductor detectors. The general problems of pulse shaping to optimize resolution with constraints imposed by noise, counting rate and rise time fluctuations are discussed.'

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Cited by 139 publications
(49 citation statements)
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“…In Fig. 1 we compare, on an arbitrary vertical scale, the CR-RC shaping network to other two shaping networks that are among the most commonly used in nuclear spectroscopy: the so-called sin 4 and sin 6 shaping networks. The amplitude of the responses to an ideal pulse (infinitesimal rise time) is normalized to 1 and the numbers in parenthesis show the time vs. amplitude value of the waveforms at the 1 This work was performed under the auspices of the Department of Energy under contract No.…”
Section: Circuitmentioning
confidence: 99%
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“…In Fig. 1 we compare, on an arbitrary vertical scale, the CR-RC shaping network to other two shaping networks that are among the most commonly used in nuclear spectroscopy: the so-called sin 4 and sin 6 shaping networks. The amplitude of the responses to an ideal pulse (infinitesimal rise time) is normalized to 1 and the numbers in parenthesis show the time vs. amplitude value of the waveforms at the 1 This work was performed under the auspices of the Department of Energy under contract No.…”
Section: Circuitmentioning
confidence: 99%
“…This is especially bothersome at higher energies (above 100 keV) because of the longer interaction length of the more energetic photons [3]. When the detector material presents different mobility and trapping phenomena for electrons and holes, the resulting image charge induced on the collection electrode has a shape that depends on how far from such electrode the interaction took place [4]. Moreover, high energy photons also present Compton scattering phenomena that introduce complex structure in the image charge.…”
Section: Introductionmentioning
confidence: 99%
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“…7 ~ diode indicate that the main contribution to the measured noise in this bias range is due to delta noise [7] which is proportional to the diode capacitance.…”
Section: Introductionmentioning
confidence: 99%
“…Since the a-Si:H layers in these devices are limited to a few 1. 1 m thickness and their electrodes are all parallel plates, the detector capacitance is fairly large and so is the noise component known as the delta noise in the standard nuclear electronics for single particle detection [ 4]. Therefore, it is difficult to operate these devices in pulse mode (counting individual panicles).…”
Section: Introductionmentioning
confidence: 99%