2021
DOI: 10.1021/acs.cgd.1c00334
|View full text |Cite
|
Sign up to set email alerts
|

Significant Enhancement in Optoelectronic Properties of γ-CuxAg1–xI Films Induced by Highly (111)-Preferred Orientation and Cu Content at Room Temperature

Abstract: Crystallographic orientations play a crucial part in optoelectronic properties of crystalline materials. This paper reported significant enhancement of optoelectronic properties in γ-phase copper silver iodide (γ-Cu x Ag 1−x I, 0.6 ≤ x ≤ 0.9) films compared with Cu-poor (0.1 ≤ x ≤ 0.4) counterparts due to highly (111)-preferred orientation and larger grains. Transient surface photovoltage spectroscopy reveals that Cu x Ag 1−x I (0.6 ≤ x ≤ 0.9) exhibits faster transferring rate and slower recombination rate of … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2022
2022
2023
2023

Publication Types

Select...
5

Relationship

3
2

Authors

Journals

citations
Cited by 6 publications
(3 citation statements)
references
References 31 publications
0
3
0
Order By: Relevance
“…To predict the photovoltaic performance of devices assembled with large-grain spanning absorbers, a transient surface photovoltage (TSPV) test was conducted on CZTSSe films. [33][34][35][36] TSPV test configuration is illustrated in Figure 5a. A 355 nm pulse laser with a pulse width of 4 ns was first processed by a reflector and then utilized for exciting the CZTSSe films in a shielding box.…”
Section: Resultsmentioning
confidence: 99%
“…To predict the photovoltaic performance of devices assembled with large-grain spanning absorbers, a transient surface photovoltage (TSPV) test was conducted on CZTSSe films. [33][34][35][36] TSPV test configuration is illustrated in Figure 5a. A 355 nm pulse laser with a pulse width of 4 ns was first processed by a reflector and then utilized for exciting the CZTSSe films in a shielding box.…”
Section: Resultsmentioning
confidence: 99%
“…This significant increase in T r suggests a significant inhibition of nonradiative recombination. [44][45][46][47] In addition, the band tailing was calculated by determining the energy difference between the derivative of EQE (dEQE/d𝜆) and the peak value of PL (E g − E PL ), where E PL represents the PL emission peak energy. The difference is 6 meV of the control sample and 2 meV of the Na 2 (Se 2 S)−7.5 sample, indicating less band tailing in the Na 2 (Se 2 S)−7.5 sample.…”
Section: Device Performance and Defects Passivationmentioning
confidence: 99%
“…As a result, a smaller fraction of silver bismuth and a larger fraction of bismuth octahedra would be beneficial to reduce the bandgap. The fabrication of films based on metal elemental surface reaction is a kind of redox reaction with elemental material sputtered film as raw material, which is beneficial to tune the element ratio and improve the quality of film formation [17,[26][27][28].…”
Section: Introductionmentioning
confidence: 99%