2019
DOI: 10.1007/s11595-019-2031-0
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Significant Inhibition of IMCs Growth between an Electroless Ni-W-P Metallization and SAC305 Solder During Soldering and Aging

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Cited by 6 publications
(1 citation statement)
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“…The differential in temperature encourages atom diffusion and grain development. According to widespread consensus [29] , the Ni 3 Sn 4 layer at the Ni/Sn interface serves as a diffusion barrier layer, but the presence of a temperature gradient may effectively reduce the barrier effect and encourage the diffusion of Ni atoms from the Ni skeleton into Sn solder [12] , [30] .…”
Section: Resultsmentioning
confidence: 99%
“…The differential in temperature encourages atom diffusion and grain development. According to widespread consensus [29] , the Ni 3 Sn 4 layer at the Ni/Sn interface serves as a diffusion barrier layer, but the presence of a temperature gradient may effectively reduce the barrier effect and encourage the diffusion of Ni atoms from the Ni skeleton into Sn solder [12] , [30] .…”
Section: Resultsmentioning
confidence: 99%