2023
DOI: 10.1002/adpr.202300054
|View full text |Cite
|
Sign up to set email alerts
|

Silicon Compound Nanomaterials: Exploring Emission Mechanisms and Photobiological Applications

Ateet Dutt,
Rafael Antonio Salinas,
Shirlley E. Martínez-Tolibia
et al.

Abstract: After the first visible photoluminescence (PL) from porous silicon (pSi), continuous efforts are made to fabricate Si‐based compound nanomaterials embedded in matrices such as oxide, nitride, and carbide to improve optical performance and industrial acceptability. These nanomaterials’ functional and desired properties (nanoparticles and quantum dots embedded in matrices) can vary significantly when embedded in technologically relevant matrices. However, exploring the exact emission mechanisms is one of the rem… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 9 publications
(1 citation statement)
references
References 296 publications
(468 reference statements)
0
1
0
Order By: Relevance
“…Likewise, SiN X thin films exhibit a dielectric constant between 6 and 9, bandgap energy (E g ) in the range of 2.4-5.2 eV, considerable optical transmittance from 0.25 nm to 8 μm, and refractive index between 1.6 and 2.7 [1][2][3][4]. The electrical and optical properties that SiN X exhibits when formed in a thin film have allowed its incorporation into microelectronics [3,[5][6][7][8][9][10][11][12][13] and photonics [14][15][16][17][18][19][20]-standing out in recent years as a potential alternative in silicon-based photonic platforms and photonic quantum computing [4,[20][21][22][23][24][25].…”
Section: Introductionmentioning
confidence: 99%
“…Likewise, SiN X thin films exhibit a dielectric constant between 6 and 9, bandgap energy (E g ) in the range of 2.4-5.2 eV, considerable optical transmittance from 0.25 nm to 8 μm, and refractive index between 1.6 and 2.7 [1][2][3][4]. The electrical and optical properties that SiN X exhibits when formed in a thin film have allowed its incorporation into microelectronics [3,[5][6][7][8][9][10][11][12][13] and photonics [14][15][16][17][18][19][20]-standing out in recent years as a potential alternative in silicon-based photonic platforms and photonic quantum computing [4,[20][21][22][23][24][25].…”
Section: Introductionmentioning
confidence: 99%