Silicon Detectors for Low Energy Particle Detection

Tindall,; Palaio,; Ludewigt,; Holland,; Larson,; Curtis,; McBride,; Moreau,; Lin, Pei-Chun; Angelopoulos,

doi:10.1109/nssmic.2006.354170

Cited by 4 publications

(8 citation statements)

References 18 publications

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“…The energy threshold is determined by thickness of the detector contacts and the intrinsic detector capacitance. According to Tindall et al [], “The electric field does not penetrate the contact fully and hence electron hole pairs created in this field free region have a significant probability of recombining before they can be collected. Incident particles that are not energetic enough to enter the active region of the device will not be detected.…”

Section: Detectors and Overall Geometric Factormentioning

confidence: 99%

“…Incident particles that are not energetic enough to enter the active region of the device will not be detected. For silicon detectors with contacts that have been fabricated using standard ion implantation techniques the junction depth has been reported to be about 3000 Å, a window thickness corresponding to about a 30 keV threshold for protons (20 keV for electrons).” However, recent advances in lowering the energy threshold for SSSDs now make it possible to construct an array of thin‐contact, passively cooled, solid‐state detector pixels with a lower energy threshold of only 2 keV for electrons [ Tindall et al , ]. Suggested for use in plasma instruments by Ritzau et al [] who demonstrated their suitability in laboratory experiments, thin‐contact SSSD detectors are now in use in space in the In‐situ Measurements of Particles And CME Transients SupraThermal Electron instrument on the STEREO mission [ Lin et al , ], in the Solid State Telescopes on the THEMIS mission [ Angelopoulos , ], and in the STEIN instrument on the CINEMA spacecraft as noted previously.…”

Section: Detectors and Overall Geometric Factormentioning

confidence: 99%

“…For the purposes of calculation of overall instrument geometric factor and energy range, we assume here that this instrument will employ low‐power consumption SSSDs [ Tindall et al, ] with an energy threshold 1.1 keV for electrons and 2.3 keV for ions. When electronic noise is included, this corresponds to a low‐energy limit of 5 keV for ions.…”

Section: Detectors and Overall Geometric Factormentioning

confidence: 99%

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Key elements of a low voltage, ultracompact plasma spectrometer

et al. 2016

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Taking advantage of technological developments in wafer‐scale processing over the past two decades, such as deep etching, 3‐D chip stacking, and double‐sided lithography, we have designed and fabricated the key elements of an ultracompact (1.5 cm)3 plasma spectrometer that requires only low‐voltage power supplies, has no microchannel plates, and has a high aperture area to instrument volume ratio. The initial design of the instrument targets the measurement of charged particles in the 3–20 keV range with a highly directional field of view and a 100% duty cycle; i.e., the entire energy range is continuously measured. In addition to reducing mass, size, and voltage requirements, the new design will affect the manufacturing process of plasma spectrometers, enabling large quantities of identical instruments to be manufactured at low individual unit cost. Such a plasma spectrometer is ideal for heliophysics plasma investigations, particularly for small satellite and multispacecraft missions. Two key elements of the instrument have been fabricated: the collimator and the energy analyzer. An initial collimator transparency of 20% with 3° × 3° angular resolution was achieved. The targeted 40% collimator transparency appears readily achievable. The targeted energy analyzer scaling factor of 1875 was achieved; i.e., 20 keV electrons were selected for only a 10.7 V bias voltage in the energy analyzer.

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Section: Detectors and Overall Geometric Factormentioning

confidence: 99%

Section: Detectors and Overall Geometric Factormentioning

confidence: 99%

Section: Detectors and Overall Geometric Factormentioning

confidence: 99%

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Key elements of a low voltage, ultracompact plasma spectrometer

et al. 2016

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“…STE consists of arrays of small, low capacitance, cooled SSDs ( Fig. 1), fabricated with an unusually thin window dead layer (Tindall et al 2008), so <∼2 keV electrons can penetrate and be detected. The SSDs are surrounded by a guard ring and passively cooled to ∼−30 to −90°C to minimize leakage current, and coupled to state-of-the-art, cooled FET, pulse-reset preamp-shaping electronics to obtain an electronic threshold of ∼1.5 keV.…”

Section: Instrument Overviewmentioning

confidence: 99%

The STEREO IMPACT Suprathermal Electron (STE) Instrument

et al. 2008

Self Cite

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The Suprathermal Electron (STE) instrument, part of the IMPACT investigation on both spacecraft of NASA's STEREO mission, is designed to measure electrons from ∼2 to ∼100 keV. This is the primary energy range for impulsive electron/ 3 He-rich energetic particle events that are the most frequently occurring transient particle emissions from the Sun, for the electrons that generate solar type III radio emission, for the shock accelerated electrons that produce type II radio emission, and for the superhalo electrons (whose origin is unknown) that are present in the interplanetary medium even during the quietest times. These electrons are ideal for tracing heliospheric magnetic field lines back to their source regions on the Sun and for determining field line lengths, thus probing the structure of interplanetary coronal mass ejections (ICMEs) and of the ambient inner heliosphere. STE utilizes arrays of small, passively cooled thin window silicon semiconductor detectors, coupled to state-of-the-art pulse-reset front-end electronics, to detect electrons down to ∼2 keV with about 2 orders of magnitude increase in sensitivity over previous sensors at energies below ∼20 keV. STE provides energy resolution of E/E ∼ 10-25% and the angular resolution of ∼20°over two oppositely directed ∼80°× 80°fields of view centered on the nominal Parker spiral field direction.

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“…[1][2][3][4][5][6][7][8] Standard types of electron sources are typically used for these purposes, although they often have limitations that increase their complexity for use or constrain their utility. For example, beta sources generate electrons from radioactive decay, are readily available, and provide stable, predictable electron fluxes; however, they generate a broad spectrum of electron energies, are potentially hazardous, are often accompanied by gamma ray emission, and are limited in flux and energy range.…”

Section: Introductionmentioning

confidence: 99%

Ultraviolet stimulated electron source for use with low energy plasma instrument calibration

Henderson

Harper

Funsten

et al. 2012

Review of Scientific Instruments

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We have developed and demonstrated a versatile, compact electron source that can produce a monoenergetic electron beam up to 50 mm in diameter from 0.1 to 30 keV with an energy spread of <10 eV. By illuminating a metal cathode plate with a single near ultraviolet (UV) light emitting diode (LED), a spatially uniform electron beam with 15% variation over 1 cm 2 can be generated. A uniform electric field in front of the cathode surface accelerates the electrons into a beam with an angular divergence of <1• at 1 keV. The beam intensity can be controlled from 10 − 10 9 electrons cm −2 s −1 .

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Silicon Detectors for Low Energy Particle Detection

Cited by 4 publications

References 18 publications

Key elements of a low voltage, ultracompact plasma spectrometer

Key elements of a low voltage, ultracompact plasma spectrometer

The STEREO IMPACT Suprathermal Electron (STE) Instrument

Ultraviolet stimulated electron source for use with low energy plasma instrument calibration

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