2002
DOI: 10.1557/proc-737-e14.5
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Silicon Epitaxial Regrowth Passivation of SiGe Nanostructures Pattered by AFM Oxidation

Abstract: SiGe quantum devices were demonstrated by AFM oxidation and selective wet etching with features size down to 50 nm. To passivate the devices and eliminate the interface states between Si/SiO2, low temperature regrowth of epitaxial silicon over strained SiGe has been tested. The silicon regrowth on Si0.8Ge0.2 was done by rapid thermal chemical vapor deposition (RTCVD) at 700 °C using a hydrogen pre-cleaning process at 800 °C and 10 torr. SIMS analysis and photoluminescence (PL) of strained SiGe capped with epit… Show more

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Cited by 1 publication
(2 citation statements)
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“…To pattern thicker structures, we then adopted a 2-step transfer method [21]. For example, if one wants to pattern a 8-nm SiGe layer, one can first oxidize a thin (2 nm) Si layer on top of it by AFM oxidation.…”
Section: Ihb Nanopatterning Technology Mb 1 Afm-based Low-energymentioning
confidence: 99%
See 1 more Smart Citation
“…To pattern thicker structures, we then adopted a 2-step transfer method [21]. For example, if one wants to pattern a 8-nm SiGe layer, one can first oxidize a thin (2 nm) Si layer on top of it by AFM oxidation.…”
Section: Ihb Nanopatterning Technology Mb 1 Afm-based Low-energymentioning
confidence: 99%
“…100 meV) and the devices varied from scan to scan as carriers moved in and out of traps [26]. We then passivated the dot surfaces with the low-temperature epitaixal regrowth of silicon by chemical vapor deposition [27]. A critical issue was the ability to clean the interface before growth at low temperature (to avoid dopant diffusion) [28].…”
Section: Iiib2 Nano-contactsfor Ultra-small (<10 Nm) Devicesmentioning
confidence: 99%