“…The phase composition of the composite was further studied through X-ray diffraction (XRD) patterns. As shown in Figure 2 a, all composites exhibit diffraction peaks of crystalline Si at 2θ = 28.5°, 47.7°, 56.2°, 69.2°, and 76.3°, corresponding to the (111), (220), (311), (400), and (331) planes of Si [ 33 ], respectively. In the Si@SnO 2 composite, characteristic peaks of SnO 2 appear at 2θ = 26.5°, 33.8°, and 51.7°, corresponding to the (110), (101), and (211) planes of SnO 2 [ 34 ], respectively, indicating that a layer of SnO 2 is successfully coated on the surface of Si through the annealing process.…”