Modern Technologies for Creating the Thin-Film Systems and Coatings 2017
DOI: 10.5772/66992
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Silicon Oxycarbide Thin films and Nanostructures: Synthesis, Properties and Applications

Abstract: Silicon oxycarbide (SiC x O y ) has been extensively investigated due to its wide use in the Si semiconductor industry in applications that include low-k dielectrics, passivation layers, and etch-stop layers. Furthermore, SiC x O y research has been exploring its prospective use in numerous other technological usages, such as lighting, energy, and biological applications. The latter include white light-emitting materials, hydrogen storage materials, gas sensors, anode materials for lithium batteries, and biome… Show more

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Cited by 22 publications
(24 citation statements)
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References 79 publications
(134 reference statements)
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“…When these findings are combined to FTIR, wettability and SEM results, it can be inferred that PO 2 and PII groups have structural differences, even though both have a silicon-based structure, with a reduced content of C. A silica-like [50] and silicon oxycarbide-like [58] structure, respectively, are seen for these groups, while PAr coating presented a typical organosilicon structure.…”
Section: Discussionmentioning
confidence: 94%
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“…When these findings are combined to FTIR, wettability and SEM results, it can be inferred that PO 2 and PII groups have structural differences, even though both have a silicon-based structure, with a reduced content of C. A silica-like [50] and silicon oxycarbide-like [58] structure, respectively, are seen for these groups, while PAr coating presented a typical organosilicon structure.…”
Section: Discussionmentioning
confidence: 94%
“…The methyl groups shields the polar Si-O-Si groups vanishing their electrostatic effect on the polar water molecules. Differently occur for the PO 2 (silica-like) and PII (silicon oxy carbide-like) prepared samples, since higher proportions of methyl groups are abstracted during the deposition, thus explaining the higher affinity of these two samples towards water [49,58].…”
Section: Discussionmentioning
confidence: 98%
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“…10a-i) showed the peak of Si 2p to consist of a Gaussian peak for Si 4+ (Si-O 4 ) at 102.6 eV and a Gaussian peak for Si + (Si 3 -Si-O) at 100.6 eV. 31,32 There was no corresponding peak for Si + (Si 3 -Si-O) in the XPS spectrum of the conventional silicone gel (see Fig. 10b-ii).…”
Section: Gelation Of Dimethylpolysiloxane (Silicone)mentioning
confidence: 98%
“…Recently, Lin et al reported the growth of amorphous SiC x O y by very high-frequency PECVD technique [ 88 ]. An extensive review on the synthesis and properties of SiC x O y films is presented in [ 89 ]. In addition, SiCN films have been preferentially grown by PECVD methods.…”
Section: Chemical Vapor Synthesis Of Sic Films: From Cvd To Aldmentioning
confidence: 99%