Intensive efforts have been conducted to realize the
reliable interfacial
joining of thermoelectric materials and electrode materials with low
interfacial contact resistance, which is an essential step to make
thermoelectric materials into thermoelectric devices for industrial
application. In this review, the roles of structural integrity, interdiffusion,
and contact resistance in long-term reliabilities of thermoelectric
modules are outlined first. Then interfacial reactions of near-room-temperature
Bi2Te3-based thermoelectric materials and various
electrode materials are reviewed comprehensively. We also summarized
the joining behavior of the mid-temperature PbTe-based thermoelectric
materials and commonly used electrode materials. Subsequently, for
other thermoelectric materials systems, i.e., SiGe, CoSb3, and Mg3Sb2, previous attempts to join with
some electrode materials are also recapitulated. Finally, some future
prospects to further improve the joint reliability in thermoelectric
device manufacturing are proposed. We believe that this review will
provide guidance for preparing thermoelectric devices and optimizing
thermoelectric device design.