2006
DOI: 10.1063/1.2206778
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Simple and inexpensive time-of-flight charge-to-mass analyzer for ion beam source characterization

Abstract: New design for a time-of-flight mass spectrometer with a liquid beam laser desorption ion source for the analysis of biomolecules Rev.

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Cited by 74 publications
(26 citation statements)
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“…This facility has been described in detail elsewhere [12]- [14]. The broad-beam ion source can be repetitively pulsed at rates up to ∼50 pulses/s, and the extracted ion beam current can be up to ∼1 A peak or ∼10 mA time averaged.…”
Section: Surface Modificationmentioning
confidence: 99%
“…This facility has been described in detail elsewhere [12]- [14]. The broad-beam ion source can be repetitively pulsed at rates up to ∼50 pulses/s, and the extracted ion beam current can be up to ∼1 A peak or ∼10 mA time averaged.…”
Section: Surface Modificationmentioning
confidence: 99%
“…The ion source ( Fig.1) consists of a plasma source, and three grid of multiaperture system of the acceleration-deceleration type. Ion beam mass/charge state distributions were measured by a time-of-flight (TOF) spectrometer [7]. The TOF instrument has a drift length of 1.03 m and the detector was a magnetically suppressed Faraday cup.…”
Section: Experimental Set-upmentioning
confidence: 99%
“…These workpieces were obtained by uniaxial isothermal forging combined with reverse rolling as described in the work of Eroshenko et al [6] and the additional annealing at 500°С. Aluminum ions were implanted in titanium workpieces using the new version of the Mevva (Metal Vapor Vacuum Arc) ion source Mevva-V.RU described in detail in the work of Gushenets et al [7]. Titanium workpieces were exposed to ion implantation at temperature 623 K, accelerating voltage 50 kV, ionic current density 6.5 mA/cm 2 , distance 60 cm from the ion-optical system, implantation time 5.25 h, and fluence 1·10 18 ion/cm 2 .…”
Section: Methodsmentioning
confidence: 99%