Simple assembly of long nanowires through substrate stretching

Dong, Jianjin; Abukhdeir, Nasser Mohieddin; Goldthorpe, Irene A.

doi:10.1088/0957-4484/26/48/485302

Cited by 20 publications

(33 citation statements)

References 38 publications

(62 reference statements)

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“…In this work, both filtering and thresholding methods are used which are essentially unchanged from past work [7][8][9][10], although they will be summarized here for clarity. However, the presented image processing method differs substantially from past approaches in that mathematical morphology methods [34,35] are used for object detection and characterization, as opposed to computationally intensive shape fitting tasks used in past work [7][8][9][10]. The filtering and thresholding tasks are used to remove measurement noise from the raw microscopy image and segment the grayscale image into a binary image, respectively.…”

Section: Methodsmentioning

confidence: 99%

“…Given a binary image, past work [7,10] used least-squares fitting of ellipses to foreground objects to identify candidate one-dimensional nanostructures. This single operation both uniquely identifies foreground objects and provides approximations of their morphological quantities such as major axis length, minor axis length, aspect ratio, eccentricity, and axes orientations.…”

Section: Methodsmentioning

confidence: 99%

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Automated quantification of one-dimensional nanostructure alignment on surfaces

Dong¹,

Goldthorpe²,

Abukhdeir³

2016

Nanotechnology

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A method for automated quantification of the alignment of one-dimensional (1D) nanostructures from microscopy imaging is presented. Nanostructure alignment metrics are formulated and shown to be able to rigorously quantify the orientational order of nanostructures within a two-dimensional domain (surface). A complementary image processing method is also presented which enables robust processing of microscopy images where overlapping nanostructures might be present. Scanning electron microscopy (SEM) images of nanowire-covered surfaces are analyzed using the presented methods and it is shown that past single parameter alignment metrics are insufficient for highly aligned domains. Through the use of multiple parameter alignment metrics, automated quantitative analysis of SEM images is shown to be possible and the alignment characteristics of different samples are able to be quantitatively compared using a similarity metric. The results of this work provide researchers in nanoscience and nanotechnology with a rigorous method for the determination of structure/property relationships, where alignment of 1D nanostructures is significant.

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Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Automated quantification of one-dimensional nanostructure alignment on surfaces

Dong¹,

Goldthorpe²,

Abukhdeir³

2016

Nanotechnology

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“…This method provides an effective approach to achieve large‐area NW assembly coverage with controlled density. For the 2D NW assembly, strain‐release assembly has been widely employed by many research groups . Zhu and co‐workers assembled NWs on top of elastomeric substrates by applying strain‐release assembly .…”

Section: D Nw Assemblies For Flexible Electronic Devicesmentioning

confidence: 99%

“…Goldthorpe and co‐workers also illustrated the low‐cost, large‐area, NW alignment by stretching PVA films to 450% of the original size. [90a]…”

Section: D Nw Assemblies For Flexible Electronic Devicesmentioning

confidence: 99%

Nanowire Assemblies for Flexible Electronic Devices: Recent Advances and Perspectives

et al. 2018

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The fabrication of nanowire (NW)‐based flexible electronics including wearable energy storage devices, flexible displays, electrical sensors, and health monitors has received great attention both in fundamental research and market requirements in our daily lives. Other than a disordered state after synthesis, NWs with designed and hierarchical structures would not only optimize the intrinsic performance, but also create new physical and chemical properties, and integration of individual NWs into well‐defined structures over large areas is one of the most promising strategies to optimize the performance of NW‐based flexible electronics. Here, the recent developments and achievements made in the field of flexible electronics composed of integrated NW structures are presented. The different assembly strategies for the construction of 1D, 2D, and 3D NW assemblies, especially the NW coassembly process for 2D NW assemblies, are comprehensively discussed. The improvements of different NW assemblies on flexible electronics structure and performance are described in detail to elucidate the advantages of well‐defined NW assemblies. Finally, a short summary and outlook for future challenges and perspectives in this field are presented.

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“…These techniques overall show a low ratio of aligned nanowires when they are not combined with other techniques [34, 40]. A successful example in this type of alignment techniques is the use of strain release on highly stretchable substrates where an accurate alignment of nanowires on a flexible substrate as large as 2 inch × 6 inch was achieved [41]. However, this method requires high elasticity of the substrate as well as application of large forces between the elastic substrate and the nanowires, which significantly limits the applicability of this method.…”

Section: Introductionmentioning

confidence: 99%

Patterned electromagnetic alignment of magnetic nanowires

Beheshti

Choi

Geng

et al. 2018

Microelectronic Engineering

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A combination of electromagnetic alignment and topological pattern assisted alignment to position magnetic nanowires, which is referred to as the Patterned Electromagnetic Alignment (PEA), is developed and examined. Electrodeposited, FeNiCo nanowires with different lengths were used as the test nanomaterial, and the microscale grooved surface was formed by UV nanoimprint lithography. The accuracy of the PEA with FeNiCo nanowires was evaluated by measuring the deviation angle from the direction of the magnetic field line for different magnetic field strengths and nanowire lengths, and a statistical alignment distribution was reported for different nanowire length groups. The results were compared with those of the electromagnetic alignment on flat surfaces and in grooved-patterned substrates without electromagnetic alignment. Overall, the deviation angle for the PEA was lower than that for the electromagnetic alignment when all other experimental conditions were identical, indicating that the alignment accuracy along the direction of the magnetic field lines was enhanced in the presence of surface micro grooves. This can be attributed to the fact that, upon attachment of nanowires to the substrate surface, the surface micro grooves in the PEA add additional deterministic characteristics to the otherwise stochastic nature of the nanowire deposition and solvent evaporation processes compared to the sole electromagnetic alignment.

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Simple assembly of long nanowires through substrate stretching

Cited by 20 publications

References 38 publications

Automated quantification of one-dimensional nanostructure alignment on surfaces

Automated quantification of one-dimensional nanostructure alignment on surfaces

Nanowire Assemblies for Flexible Electronic Devices: Recent Advances and Perspectives

Patterned electromagnetic alignment of magnetic nanowires

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