Simple high-temperature proportional detector for conversion-electron Mössbauer spectroscopy

Zhou, Xuezhi; Morrish, A. H.

doi:10.1016/s0168-583x(86)80032-5

Cited by 2 publications

(1 citation statement)

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“…Typically, the average detection depth of CEMS is about 100 nm [11]. It can thus provide information on the magnetic moments in a corresponding range from the ends of the nanowires.…”

Section: Relative Transmissionmentioning

confidence: 99%

Magnetic texture in iron nanowire arrays

et al. 2004

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Highly ordered iron arrays of nanowires with different diameters have been prepared by the electrochemical deposition method, with the intention of studying magnetic texture in this system. Crystal texture with the [110] direction along the axis of the nanowires is demonstrated by x-ray diffraction measurements. The orientation of the magnetic moments is along the long axis of the nanowire, a result deduced from the transmission Mössbauer spectra of the as-prepared sample and the remanent states. However, as the intensity of the second and fifth lines is larger in conversion electron Mössbauer spectra than that in transmission Mössbauer spectra for the same diameter samples, the orientation of the magnetic moments appears to deviate from the axis more at the ends than that in the middle of the nanowires. On increasing the nanowire diameter, the magnetic texture becomes weaker. Large coercive force can be found for the small diameter samples when the external magnetic field is applied along the long axis of the nanowires.

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“…Typically, the average detection depth of CEMS is about 100 nm [11]. It can thus provide information on the magnetic moments in a corresponding range from the ends of the nanowires.…”

Section: Relative Transmissionmentioning

confidence: 99%