“…As compared with other clusters such as SF 6 (MW = 146.1), Au 3 (MW = 590.9), and C 60 (MW = 720), these metal cluster complexes have higher molecular weights; hence, they are expected to be superior to conventional primary ion beams in SIMS. Thus, after an initial test on silicon sputtering [15], we have performed SIMS analyses of inorganic and organic materials using Ir 4 (CO) 12 , thereby demonstrating that the metal cluster complex ion beam can improve depth resolution and secondary ion intensity in high-mass region [16][17][18]. In the present paper, after a brief description of the experimental apparatus and analytical samples, experimental results of sputtering characteristics of silicon and the SIMS analyses with the metal cluster complex ion, Ir 4 (CO) 7 + (MW = 964.9), are described.…”