2022
DOI: 10.1017/s1431927622001039
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SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging

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Cited by 3 publications
(1 citation statement)
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“…ZEISS has emerged as a trailblazer through its exceptional strides in the development of Focused Ion Beam SIMS (FIB-SIMS) [23], contributing significantly to the intricate characterization of materials at the nanoscale. This imaging mode SIMS coupled with FIB was based on the development of the Luxembourg Institute of Technology SIMS [24][25][26], which currently lacks high mass accuracy and wide mass range.…”
Section: Introductionmentioning
confidence: 99%
“…ZEISS has emerged as a trailblazer through its exceptional strides in the development of Focused Ion Beam SIMS (FIB-SIMS) [23], contributing significantly to the intricate characterization of materials at the nanoscale. This imaging mode SIMS coupled with FIB was based on the development of the Luxembourg Institute of Technology SIMS [24][25][26], which currently lacks high mass accuracy and wide mass range.…”
Section: Introductionmentioning
confidence: 99%