SIMS/XPS Studies of Surface Layer Formed in Fe-Si-Mn Alloys by Oxygen Penetration.

Suzuki, Shigeru; Hasegawa, Haijme; Mizoguchi, Shozo; Waseda, Yoshio

doi:10.2355/isijinternational.43.71

Cited by 6 publications

(7 citation statements)

References 17 publications

(21 reference statements)

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“…The thickness of the oxide thin films increased with aluminum content. The refractivity values were consistent with that of aluminum oxides [17,18], although the refractivity of Sample A was lower than those of Samples B and C. This indicated that the chemical composition or density of the oxide film of Sample A deviated from that of aluminum oxide, which may arise from vanadium enrichment between the oxide film and substrate. Figure 8 shows the thickness values of aluminum oxide films on the FeCo-V alloys measured using ellipsometry versus aluminum content.…”

Section: Ellipsometry and CLsupporting

confidence: 58%

Characterization and Control of Aluminum Oxide Thin Films Formed on Surfaces of FeCo-V Alloys

Kasuya

Imashuku

Wagatsuma

et al. 2020

e-J. Surf. Sci. Nanotechnol.

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X-ray photoelectron spectroscopy (XPS), ellipsometry, and cathode luminescence were utilized for characterizing oxide films formed on the surfaces of FeCo-V alloys (Permendur) that contained small amounts of aluminum via annealing under a low partial pressure of oxygen. XPS spectra showed that the oxide films were composed primarily of aluminum oxide, which was a result of preferential oxidation of aluminum on the surfaces of the alloys during annealing. The thicknesses of the oxide films were estimated from XPS depth profiles coupled with the sputtering rate of a SO2/Si film, and the thicknesses were compared with those of the oxide films measured via non-destructive ellipsometry. The thicknesses obtained from the depth profiles may have been overestimated because of a difference in sputtering rate between silicon oxide and aluminum oxide. As measured via ellipsometry, the thickness of the aluminum oxide thin film, which was less than 100 nm, increases with the aluminum content in the alloys. Wide XPS spectra from the sample surfaces with different roughness suggested that the aluminum oxide thin films were homogenously formed on the smooth surfaces, whereas metallic elements in the alloy substrates were detected on the rough surfaces. Furthermore, the electrical resistivity of the alloys with the smooth surfaces increases significantly with the aluminum content, which may be attributable to the formation of the aluminum oxide thin film. These results indicate that the addition of a small amount of aluminum and surface smoothness are important for controlling formation of the aluminum oxide thin films with high resistivity in FeCo-V alloys by annealing under a low partial pressure of oxygen.

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Section: Ellipsometry and CLsupporting

confidence: 58%

Characterization and Control of Aluminum Oxide Thin Films Formed on Surfaces of FeCo-V Alloys

Kasuya

Imashuku

Wagatsuma

et al. 2020

e-J. Surf. Sci. Nanotechnol.

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“…Such correlations of oxygen and a reactive element in depth profiles were also observed in Fe-Si alloys. [11,12] Formation of aluminum oxide on the alloy surface A reactive element in a surface layer is distributed by the selective oxidation of the element, which is related to the mobility of the element in the alloy matrix. [8,11] Therefore, the kinetics of the formation of Al 2 O 3 layers on the sample surfaces should be discussed on the basis of the mobility of aluminum in the ironbased alloys.…”

Section: Sims Depth Profilesmentioning

confidence: 99%

Characterization of surface oxide layers formed on FeAl alloys by annealing under different atmospheres

Suzuki¹,

Yamamoto²,

Shinoda³

et al. 2008

Surface & Interface Analysis

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XPS and SIMS were used for characterizing the surface oxide layers formed on Fe-Al alloys during annealing under atmospheres with different partial pressures of oxygen, which were controlled by H 2 O/H 2 ratios in the gas. The XPS results showed that an aluminum oxide (Al 2 O 3 ) layer was formed on the surfaces of samples annealed at a high temperature under a low partial pressure of oxygen, while such a layer was not formed on the surfaces of samples annealed under a high partial pressure of oxygen. SIMS depth profiles showed that the surfaces of samples annealed at high temperatures under a low partial pressure of oxygen were covered with a thin Al 2 O 3 layer of approximately 50 nm thickness. It was also shown that oxygen penetrated the samples annealed under a high partial pressure of oxygen, and the depth profile of oxygen was correlated with that of aluminum. This indicates that internal oxidation of aluminum occurs in the samples annealed under a high partial pressure of oxygen. Grazing-incidence X-ray diffraction (GIXD) was also employed for analyzing the structure of the Al 2 O 3 layer formed on the surface of samples annealed under a low partial pressure of oxygen.

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“…Some samples after annealing in air were further annealed in Ar‐10% H 2 at 873 K for 3600 s (Condition (d)). When the alloys are annealed under the Ar‐10% H 2 gas atmosphere in which the partial pressure of oxygen is approximately 10 −13 Pa, it is considered that gallium is oxidized, whereas iron is not oxidized in the alloys, and hydrogen has little effect on surface reaction on iron‐based alloys 11 …”

Section: Methodsmentioning

confidence: 99%

“…is considered that gallium is oxidized, whereas iron is not oxidized in the alloys, and hydrogen has little effect on surface reaction on iron-based alloys. 11…”

Section: Introductionmentioning

confidence: 99%

Surface characterization of functional iron–gallium alloys annealed under different conditions

Kawamata

Shinoda

Sugiyama

et al. 2020

Surface & Interface Analysis

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Fe-Ga alloys are functional magnetostrictive materials, which are promising for application in actuators and sensors. Because surface properties of these alloys such as corrosion resistance are important in technological applications, it is required to characterize the chemical composition and state of the surface of these alloys, which depend on annealing conditions. In this study, X-ray absorption spectroscopy (XAS) and secondary ion mass spectrometry (SIMS) were used to characterize surface layers formed on the Fe-Ga alloys annealed under different atmospheric conditions. The XAS spectra of the annealed sample showed that the amount of gallium in the surface layers increased due to annealing, whereas the XAS spectra of the aspolished alloys revealed that the amounts of iron and gallium arise from the bulk composition. The XAS spectra of the alloys annealed in argon-hydrogen with residual oxygen showed that gallium is increased for its preferential oxidation. SIMS depth profile also showed the enrichment of gallium on the surface and the inhomogeneous distribution of iron on the surface layers.

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SIMS/XPS Studies of Surface Layer Formed in Fe-Si-Mn Alloys by Oxygen Penetration.

Cited by 6 publications

References 17 publications

Characterization and Control of Aluminum Oxide Thin Films Formed on Surfaces of FeCo-V Alloys

Characterization and Control of Aluminum Oxide Thin Films Formed on Surfaces of FeCo-V Alloys

Characterization of surface oxide layers formed on FeAl alloys by annealing under different atmospheres

Surface characterization of functional iron–gallium alloys annealed under different conditions

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