2006 IEEE International Conference on Semiconductor Electronics 2006
DOI: 10.1109/smelec.2006.380792
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Simulated Dielectric Characteristics of Pt/BST/Ni-Fe/Cu Multilayer Capacitor Stack for Storage Application

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“…BST is a metal oxide dielectric substantial sample where more focus has been given to it as a result of the small dielectric loss, elevated dielectric constant, good thermal stability, adjustable cure temperature, and high breakdown feld strength properties possessed by it. BST belonging to perovskite materials has a typical perovskite arrangement of atoms [38][39][40][41], as is observed in Figure 3.…”
Section: Introductionmentioning
confidence: 84%
“…BST is a metal oxide dielectric substantial sample where more focus has been given to it as a result of the small dielectric loss, elevated dielectric constant, good thermal stability, adjustable cure temperature, and high breakdown feld strength properties possessed by it. BST belonging to perovskite materials has a typical perovskite arrangement of atoms [38][39][40][41], as is observed in Figure 3.…”
Section: Introductionmentioning
confidence: 84%