2010
DOI: 10.1016/j.ultramic.2009.09.010
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SimulaTEM: Multislice simulations for general objects

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Cited by 92 publications
(71 citation statements)
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“…Projection on the plane (010) is determined on the HREM images and used for structure modelling. Figure 2b shows the HREM images modelled using the SimulaTEM program [13]. When modelling we used the following electron microscope parameters for observing images: accelerating voltage 80 kV, spherical aberration 0.005 mm, focusing spread 5 nm, parallel beam, astigmatism 0 (corrected angle and amplitude).…”
Section: Resultsmentioning
confidence: 99%
“…Projection on the plane (010) is determined on the HREM images and used for structure modelling. Figure 2b shows the HREM images modelled using the SimulaTEM program [13]. When modelling we used the following electron microscope parameters for observing images: accelerating voltage 80 kV, spherical aberration 0.005 mm, focusing spread 5 nm, parallel beam, astigmatism 0 (corrected angle and amplitude).…”
Section: Resultsmentioning
confidence: 99%
“…Computer-assisted transmission electron microscope simulations were completed using a fully dynamical calculation multi-slice method using projected potential: (1) where U represents the coordinates in reciprocal space (u, v, w) as described by Gomez-Rodríguez [15], projecting the potential over the (001) c-axis and adjusting a and b coefficients in a range of 98 < a < 128 and 96 < b < 128 to obtain the optimal conditions in comparison to some experimental HRTEM results, as presented in the literature [3,7]. The crystallographic structures were built using a graphical user interface as presented in the builder module of the Accelrys 6.1-Materials Studio ® package with crystallographic parameters as found from Joint Committee on Powder Diffraction Standards (JCPDS) data base.…”
Section: Multislice Hrtem Simulationsmentioning
confidence: 99%
“…1.1, as in the other figures where we present simulated TEM micrographs, we used the SimulaTEM program developed by Gómez-Rodríguez et al that, unlike other programs with similar purposes, allows non-periodic structures as input [8]. The principles underlying the creation of this kind of simulated TEM micrographs (and also the real ones) will be discussed in the following sections.…”
Section: Introductionmentioning
confidence: 99%