2018 7th International Conference on Renewable Energy Research and Applications (ICRERA) 2018
DOI: 10.1109/icrera.2018.8566896
|View full text |Cite
|
Sign up to set email alerts
|

Simulation Analysis of Really Occurred Accident Caused by Short Circuit Failure of Blocking Diode and Bypass Circuit in the Photovoltaics System

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2019
2019
2023
2023

Publication Types

Select...
3
2
2

Relationship

1
6

Authors

Journals

citations
Cited by 13 publications
(3 citation statements)
references
References 8 publications
0
3
0
Order By: Relevance
“…The aforementioned heat-generation process involves a reverse current that is notably larger than that regularly generated in a short-circuited bypass diode. Therefore, attention should be given to the high risk of bypass diode burnout [10]. Effective measures for such reverse currents include installing fuses, not just reverse-current blocking diodes.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…The aforementioned heat-generation process involves a reverse current that is notably larger than that regularly generated in a short-circuited bypass diode. Therefore, attention should be given to the high risk of bypass diode burnout [10]. Effective measures for such reverse currents include installing fuses, not just reverse-current blocking diodes.…”
Section: Discussionmentioning
confidence: 99%
“…Furthermore, if a reverse-current blocking diode fails in addition to the bypass diode within a PV array, the inverse current from the sound PV array flows into the short-circuited bypass diode, increasing the risk of heat generation and burnout [9]. Therefore, it is important to ascertain the characteristics of bypass diode failure owing to indirect lightning in mechanisms wherein the bypass diode may generate heat and burnout [10]. However, the detailed failure characteristics of the bypass diode that fail because of indirect lightning surges are not clear.…”
Section: Introductionmentioning
confidence: 99%
“…The recent study showed simulation results that damaged bypass diodes by lightning strikes to lead reverse current flowed from normal string to the failed string, which generates heat and burns out. [11,12]. Furthermore, bypass diodes can deteriorate due to the high temperature of thermal runaway by rapid transitioning from forwarding bias state to reverse bias [12,13,14].…”
Section: Bypass Diode Faultmentioning
confidence: 99%