2022
DOI: 10.1108/compel-01-2022-0054
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Simulation and empirical validation of new sensitivity based reliability analysis technique for processors deployed in industrial drives

Abstract: Purpose The purpose of this study is to extend a sensitivity-based reliability technique for the processors deployed in industrial drive (ID). Design/methodology/approach The processor provides flexible operation, re-configurability, and adaptable compatibility in industrial motor drive system. A sensitivity-based model allows a robust tool for validating the system design. Sensitivity is the probability of a partial failure rate for a distributed variable; sensitivity and failure rates are also complementar… Show more

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Cited by 5 publications
(4 citation statements)
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“…Resistors are the most commonly used components in circuits and are often used to achieve functions such as current limiting, shunt, voltage reduction, load and capacitor matching with filters, and resistance matching. Although resistors are not highly valued by designers in circuit design, their impact on the circuit cannot be ignored [9]. Common fixed resistors include: metal film resistors, metal oxide film resistors, carbon film resistors, winding resistors, etc.…”
Section: Construction Of Degradation Model For Electrical Characteris...mentioning
confidence: 99%
“…Resistors are the most commonly used components in circuits and are often used to achieve functions such as current limiting, shunt, voltage reduction, load and capacitor matching with filters, and resistance matching. Although resistors are not highly valued by designers in circuit design, their impact on the circuit cannot be ignored [9]. Common fixed resistors include: metal film resistors, metal oxide film resistors, carbon film resistors, winding resistors, etc.…”
Section: Construction Of Degradation Model For Electrical Characteris...mentioning
confidence: 99%
“…Mainly, the failure rate of the device will be influenced by the quality of the material along with the environmental factors in the operating field. 31,32 The failure rate has been divided into physical failure rate λ Physical À Á , quality & technical control over manufacturing of item π PM ð Þ, and quality & technical control over manufacturing and usage π Process ð Þ for the power semiconductor devices.…”
Section: Performance Assessment Of the MLI Topologies In Terms Of Swi...mentioning
confidence: 99%
“…In this work, the Bottom‐up statistical and Bottom‐up‐physics of failure methods have been used for the failure rate evaluation in terms of historical and experimental data. Mainly, the failure rate of the device will be influenced by the quality of the material along with the environmental factors in the operating field 31,32 . The failure rate has been divided into physical failure rate ()λitalicPhysical, quality & technical control over manufacturing of item ()πitalicPM, and quality & technical control over manufacturing and usage ()πProcess for the power semiconductor devices.…”
Section: Performance Assessment Of the MLI Topologies In Terms Of Swi...mentioning
confidence: 99%
“…Reliability is the potential of the device, which gives the required function for a particular period. On the other hand, reliability plays an important role from product improvement to cost-saving during the manufacturing process (Rao and Chitra, 2023). The term “reliability” refers to designers’ efforts to decrease the likelihood of failure as much as feasible (Thiel et al , 2022).…”
Section: Empirical Relations In Reliability Estimationmentioning
confidence: 99%