2017 IEEE 23rd International Symposium on on-Line Testing and Robust System Design (IOLTS) 2017
DOI: 10.1109/iolts.2017.8046211
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Simulation-based analysis of FF behavior in presence of power supply noise

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Cited by 2 publications
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“…A well-known fact is that there is a trade-off between having a low quiescent current and a transient response or power supply ripple reduction, which were the motivations of past studies. The transient response degradation causes MCU to malfunction [3], [4]; thus, it is recognized as a significant characteristic of power management IC. The fast current slew rate (SR) to the gate of the pass transistor realizes a fast settling time and small undershoot and overshoot.…”
Section: Introductionmentioning
confidence: 99%
“…A well-known fact is that there is a trade-off between having a low quiescent current and a transient response or power supply ripple reduction, which were the motivations of past studies. The transient response degradation causes MCU to malfunction [3], [4]; thus, it is recognized as a significant characteristic of power management IC. The fast current slew rate (SR) to the gate of the pass transistor realizes a fast settling time and small undershoot and overshoot.…”
Section: Introductionmentioning
confidence: 99%