Simulation for deposition of cadmium telluride thin films in hot wall epitaxial system using Monte Carlo technique

Venkatachalam, T.; Ganesan, S. M.; Sakthivel, K

doi:10.1088/0022-3727/39/8/026

Cited by 4 publications

(3 citation statements)

References 39 publications

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“…The darkness increases with increase in thickness of the thin films. Figure 2 110), ( 111), ( 200), ( 210) and (211) reflections of the rock salt structure [5,[12][13][14][15][16][17][18][19][20][21].…”

Section: Resultsmentioning

confidence: 99%

“…The computer simulation for the deposition of CdSnTe thin films in the hot wall epitaxial system is carried out using a computer with the help of the MATLAB software [11]. The total number of intermolecular collisions, wall collisions and total number of molecules passing out through the exit plane directly from the entrance plane, the number density distribution along each volume section, energy of the molecule and flux density distributions at the exit plane are calculated with different source temperatures (673 -873 K), wall temperatures (623 -823 K) and design parameters (L/r) from 2 to 24 [10,12]. The source and wall temperatures are optimized as 780 K and 760 K (for CdTe), 720 K and 700 K (for Cd 0.…”

Section: Methodsmentioning

confidence: 99%

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Structural and Optical Studies of Hot Wall Vacuum Evaporated CdTeSn Thin Films

Sakthivel¹,

Velumani

Venkatachalam³

et al. 2009

AMR

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Bulk compounds of CdTe, Cd0.25Sn0.75Te and Cd0.25Te0.75Sn have been prepared by direct reaction of their high purity (99.9999%) elemental constituents employing rotating furnace. The hot wall system is optimized for the deposition of prepared alloys by using molecular flow studies with Monte Carlo simulation technique. Thin films have been deposited on well cleaned glass substrates using the prepared alloys by the optimized hot wall vacuum evaporation system. The compositions of the prepared bulk and thin films have been identified using energy dispersive X-ray analysis. The compositions are found to be same for both the bulk and thin films as the prepared alloys. The structural properties of the deposited films have been studied using X-ray diffraction technique. The results show that all the films are crystalline in nature and the peaks in the XRD graph of CdTe correspond to cubic zinc blende structure and that of Cd0.25Sn0.75Te and Cd0.25Te0.75Sn compounds to rock salt structure. The lattice parameters and grain sizes of all the films have been evaluated. The surface morphology of the thin films is studied using Scanning Electron Microscope (SEM). The SEM analysis shows that surface of the films are smooth and crystalline in nature. The optical transmittance spectra of thin films were recorded using spectrophotometer in the range of wavelength from 190 nm to 2500 nm. All the films exhibit direct optical band gap and their values are 1.45eV (CdTe), 0.9eV (Cd0.25Sn0.75Te) and 1.1eV (Cd0.25Te0.75Sn). Thicknesses of the thin films have been determined by multiple beam interferometric technique.

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Section: Resultsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Structural and Optical Studies of Hot Wall Vacuum Evaporated CdTeSn Thin Films

Sakthivel¹,

Velumani

Venkatachalam³

et al. 2009

AMR

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“…The hot wall system is concerned with the fabrication of thin films under conditions close to thermodynamic equilibrium with minimum loss of material [2]. Hgi-xCdxTe, ZnxCdi-xTe and CdxSni.xTe alloys have the unique feature of having direct band gap, tunable from the visible to the far infra red by adjusting the 'x' composition of the alloy.…”

Section: Introductionmentioning

confidence: 99%

Band structure and Optical properties CdTe and CdSn[sub 3]Te[sub 4] thin films

Venkatachalam¹,

Velumani²,

Ganesan³

et al. 2008

AIP Conference Proceedings

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CdTe and CdSn3Te4 compounds were prepared by direct reaction of their high purity elemental constituents using rotating furnace. Optimal deposition conditions for the deposition of CdTe and CdSn3Te4 thin films in hot wall evaporation setup were simulated using Monte Carlo technique. Thin films of CdTe and CdSn3Te4 were deposited on glass substrates by hot wall evaporation method. From the XRD measurements it was found that the films of CdTe and CdSn3Te4 were of cubic zinc-blende and rock salt structures respectively. The lattice parameters were determined as a = 6.476 A (CdTe) and a = 6.238 A (CdSn3Te4) from the XRD data. The UV-Vis-NIR optical transmittance spectra of thin films of different films were obtained and it was found that the direct optical band gaps were 1.4 eV (CdTe) and 0.8 eV (CdSn3Te4). Electronic structure, band parameters and optical spectra of CdTe and CdSn3Te4 were calculated from ab initio studies within the GGA approximation. The experimental results were in good agreement with the theoretical values.

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Structural and optical properties of CdSnTe2 thin films prepared by using closed space vacuum deposition

Selvakumar¹,

Venkatachalam²

2015

Materials Science in Semiconductor Processing

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Simulation for deposition of cadmium telluride thin films in hot wall epitaxial system using Monte Carlo technique

Cited by 4 publications

References 39 publications

Structural and Optical Studies of Hot Wall Vacuum Evaporated CdTeSn Thin Films

Structural and Optical Studies of Hot Wall Vacuum Evaporated CdTeSn Thin Films

Band structure and Optical properties CdTe and CdSn[sub 3]Te[sub 4] thin films

Structural and optical properties of CdSnTe2 thin films prepared by using closed space vacuum deposition

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