Simulation of electrical conductivity of silicon diodes with bismuth implanted-ion profiles

Wireless system for measuring current-voltage characteristics was developed. Software for a smartphone was developed in the integrated development environment Unity. The data about current and voltage was transmitted by Bluetooth and Wi-fi for smartphone and computer respectively. I-V curves were built on computer using program, developed in the Visual Studio package and coded in C#. For data verification the simulation of diodes’ parameters was provided by solving the Poisson equations and the drift-diffusion model.

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Wireless software-hardware complex for testing semiconductor structures

Loganchuk

Touel

Chebotarev

et al. 2019

J. Phys.: Conf. Ser.

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Simulation of electrical conductivity of silicon diodes with bismuth implanted-ion profiles

Cited by 1 publication

References 7 publications

Wireless software-hardware complex for testing semiconductor structures

Wireless software-hardware complex for testing semiconductor structures

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